QC documentation system: QC procedure lamp_mos_qc.prg for FORS2

This documentation is intended both for QC scientists and SciOps astronomers (who may want to ignore the technical information displayed in grey).
 
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NAME lamp_mos_qc.prg
VERSION 2.0 -- adapted for WAVE and FLAT for new pipeline
SYNTAX MIDAS
CALL measureQuality
from $DFS_PRODUCT/LAMP_MOS/$DATE:
inmidas -P -j "@@ $DFO_PROC_DIR/lamp_mos_qc.prg $date $PF"
INSTRUMENT FORS2
RAWTYPE LAMP_MOS
PURPOSE compares raw and product WAVE and FLAT files for FORS2 QC assessment; the plots are later reviewed within certifyProducts. The plots are stored as Postscript file in $DFO_PLT_DIR.
PROCINPUT first raw flat and arc from AB;
products: resolution table, reduced arc image, delta image,
disp residuals table, wavemap image; master screen flat and normalized master flat
QC1TABLE trending | table(s) in QC1 database:
fors2_mos_wave
TRENDPLOT trending | HealthCheck plot(s) associated to this procedure:
trend_report_MOS_lambda_c_HC.html
QC1PAGE trending | associated documentation:
moswlc/moswlc.html
QC1PLOTS
top

lamp_mos_grap1.png
top:residuals per slitlet; the number of the slitlet determines the plot symbol
bottom: average resolving power;
top panel: date; name of disp residuals table (red), setup parameters (filter, grism, mask, chip)

lamp_mos_grap2.png
each box: non-linear terms of fit and deviations from linear fit for each slitlet
top panel: date; name of disp residuals table (red), setup parameters (filter, grism, mask, chip)

lamp_mos_disp1.png
full display of reduced arc frame

lamp_mos_disp2.png
full display of averaged master flat

lamp_mos_disp3.png
full display of normalized master flat
QC1PARAM QC1 parameters written into QC1 table:
QC1db names: num_slit | n_lin_av | avg_accuracy | sig_accuracy | mean_disp_av
FITS key names: (lamp_mos_qc.prg) | QC.WAVE.ACCURACY | QC.WAVE.ACCURACY.ERROR | (lamp_mos_qc.prg)
QC1db names: central_wlen | central_resol | central_resol_rms | nlines_total
FITS key names: QC.MOS.CENTRAL.WAVELENGTH | QC.MOS.RESOLUTION | QC.MOS.RESOLUTION.RMS | QC.MOS.RESOLUTION.NLINES
QC1db names: central_resol_meanrms | nwave
FITS key names: QC.MOS.RESOLUTION.MEANRMS | QC.MOS.RESOLUTION.NWAVE
ALGORITHM Description of algorithms:
num_slit: number of slitlets identified
n_lin_av: number of identified arc lines per CCD row, averaged over all slitlets
mean_disp_av: mean dispersion, averaged over all slitlets
CERTIF Reasons for rejection:
- unusual shape of non-linear terms (e.g. double peak/valley);
- curved/slanted lines in the reduced arc image;
- several missing/empty slitlets in normalized flat field image;
- curved slitlets in the normalized master flat
- different line widths are NO cause for rejection, as observers may use different slit widths in one setup
COMMENTS Gaps due to unused slitlets do not show up in the reduced arc frame, which shows only detected slitlets.
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