CCD Test
CCD Test report
EEV 44-82
CCD name : Satriani
Serial number : 8462-14-2
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Quantum Efficiency, PRNU
Clock mode: read 350kps LR stripe512
Conversion Factor= 1.900e-/ADU ±0.006 for 24921.5ADU
RMS noise = 4.2e- ±0.4
CCD temperature : -140Cº
Window area is : X1= 59 X2= 1067 Y1= 9 Y2= 508
Bandwidth 5nm
Wav. PRNU rms% QE%
320 2.77 35.1 ±0.99
330 2.43 39.8 ±1.1
340 2.27 43 ±0.84
350 2.24 45.1 ±0.44
360 2.13 48.5 ±0.48
370 1.83 54.9 ±0.54
380 1.37 63.3 ±0.63
390 1.07 75.1 ±0.77
400 0.949 80.1 ±0.81
420 0.819 85.7 ±0.86
440 0.789 88.1 ±0.88
460 0.758 88.1 ±0.88
500 0.715 87.4 ±0.88
540 0.695 85.7 ±0.86
560 0.686 84.2 ±0.84
600 0.671 82.2 ±0.81
640 0.667 79.6 ±0.78
660 0.659 77.6 ±0.75
700 0.796 72.1 ±0.67
740 1.02 64.2 ±0.58
760 1.16 59.8 ±0.53
800 1.46 52.6 ±0.45
840 1.76 44.9 ±0.38
900 2.55 28 ±0.22
940 4.33 15.7 ±0.12
1000 7.08 4.39 ±0.033
1040 7.35 0.81 ±0.006
1100 12.3 0.0912 ±0.00068
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Low level
| Type of defect | Location (x,y) | Number of pixels affected |
| trap | x=540, y=3564 | 500 |
| hot column | x=839, y=995 | 3000 |
Bias
Nice bias frame...
| Type of defect | Location | Number of pixels affected |
3 median stacked image of one hour exposure each at -120C
Long exposure dark image
| Type of defect | Location | Number of pixels affected |
Readout noise/Conversion factor
Left readout port
Readout speed: 166kps
Conversion Factor= 1.761e-/ADU ±0.005 for 27182.6ADU
RMS noise = 3.9e- ±0.3
Right readout port
Readout speed: 166kps
Conversion Factor= 1.738e-/ADU ±0.006 for 27281.6ADU
RMS noise = 4.1e- ±0.3
Left readout port
Readout speed: 350kps
Conversion Factor= 1.908e-/ADU ±0.006 for 26984.6ADU
RMS noise = 4.2e- ±0.4
Rigth readout port
Right readout speed: 350kps
Conversion Factor= 1.891e-/ADU ±0.006 for 26914.7ADU
RMS noise = 4.4e- ±0.4
Linearity (TDI method)
not available
Dark current
to be calculated
Charge Transfer Efficiency (CTE)
Horizontal CTE = 0.9999990
Vertical CTE = 0.999997