CCD preliminary test
CCD Test report
EEV 44-82
CCD name : Ringo
Serial number : 8171-1-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Tested on Feb 2000
Quantum Efficiency, PRNU
Clock mode: read 350kps LR stripe512
Conversion Factor= 1.8325e-/ADU ±0.005786 for 24754.9ADU
RMS noise = 4.4679e- ±0.3758
CCD temperature : -140Cº
Window area is : X1= 59 X2= 1068 Y1= 11 Y2= 508
Bandwidth 5nm
Wav. PRNU rms% QE%
320 2.444 34.8 ±0.9812
330 2.123 39.6 ±1.145
340 1.977 42.9 ±0.8366
350 1.921 45.1 ±0.4423
360 1.805 48.6 ±0.4807
370 1.659 55.5 ±0.5471
380 1.453 66.5 ±0.657
390 1.327 76.2 ±0.7825
400 1.271 81.5 ±0.8257
420 1.193 87.6 ±0.8828
440 1.159 90.5 ±0.9062
460 1.121 90.7 ±0.9113
500 1.055 90.2 ±0.9042
540 1.003 88.5 ±0.8909
560 0.9775 87 ±0.8687
600 0.9259 84.5 ±0.7082
640 0.8844 82.7 ±0.8054
660 0.8915 80.7 ±0.7819
700 0.9374 76 ±0.7104
740 1.024 69.9 ±0.635
760 1.211 65.5 ±0.5855
800 1.276 55.1 ±0.4762
840 1.297 45.9 ±0.385
900 1.434 30.6 ±0.2458
940 2.513 19 ±0.1462
1000 5.468 5.01 ±0.03759
1040 6.169 0.816 ±0.006078
1100 9.956 0.0975 ±0.0007227
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected very low QE area x=1573, y=3190 400 hot pixel x=720, y=2571 1500 hot pixel x=675, y=2506 1500 hot pixel x=1786, y=2698 1500 hot pixel x=608, y=2555 1500 trap x=752, y=1083 3000 Bias
Type of defect Location Number of pixels affected hot pixel x=720, y=2571 1500 hot pixel x=675, y=2506 1500 hot pixel x=1786, y=2698 1500 hot pixel x=608, y=2555 1500
Long exposure dark image (Glowing visible and is easly avoidable by lowering the VDR voltage)
Type of defect Location Number of pixels affected hot pixel x=720, y=2571 1500 hot pixel x=675, y=2506 1500 hot pixel x=1786, y=2698 1500 hot pixel x=608, y=2555 1500 Readout noise/Conversion factor
Readout speed: 166kps
Left readout port
Conversion Factor= 1.690e-/ADU ±0.006 for 26907.3ADU
RMS noise = 4.13e- ±0.28
Readout speed: 166kps
Right readout port
Conversion Factor= 1.674e-/ADU ±0.005 for 27170.9ADU
RMS noise = 4.03e- ±0.27
Readout speed: 350kps
Left readout port
Conversion Factor= 1.834e-/ADU ±0.005 for 26603.2ADU
RMS noise = 4.46e- ±0.37
Readout speed: 350kps
Right readout port
Conversion Factor= 1.824e-/ADU ±0.006 for 26844.7ADU
RMS noise = 4.45e- ±0.37
Linearity (TDI method)
Not done
Dark current
Data to be reduced
Charge Transfer Efficiency (CTE)
Horizontal CTE = 0.9999985
Vertical CTE = 0.9999987
