Preliminary CCD tests
CCD Test report
EEV 44-82
CCD name : Rachel
Serial number : 8462-10-2
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : ---
Tested on August 2000
Quantum Efficiency, PRNU
Conversion Factor= 0.531e-/ADU ±0.001 for 20736.6ADU
RMS noise = 4.1e- ±0.2
CCD temperature : -135Cº
Window area is : X1= 61 X2= 2028 Y1= 11 Y2= 506
Bandwidth 5nm
Wav. PRNU rms% QE% Enthropy
320 4.49 54 ±1.5 7.545318
330 4.3 58.4 ±1.7 7.50145
340 4.21 63 ±1.2 7.480298
350 4.21 64.4 ±0.63 7.476821
360 4.07 66.7 ±0.66 7.443438
370 3.66 69.9 ±0.69 7.337103
380 2.76 75.2 ±0.74 7.05684
390 2.07 80.4 ±0.83 6.765366
400 1.67 82.6 ±0.84 6.549568
440 1.09 85.4 ±0.86 6.09861
460 1 84.3 ±0.85 6.013783
500 0.909 83.1 ±0.83 5.909189
540 0.912 81 ±0.82 5.911546
560 0.913 79.7 ±0.8 5.912072
600 0.938 78.1 ±0.77 5.941142
640 1.05 75.9 ±0.74 6.061024
660 1.14 74.1 ±0.72 6.152392
700 1.49 69.6 ±0.65 6.423616
740 2.16 63.3 ±0.58 6.774507
760 2.27 59 ±0.53 6.840842
800 2.36 50 ±0.43 6.887156
840 2.64 41 ±0.36 7.001454
860 2.69 35.4 ±0.3 7.026459
900 3.61 27.6 ±0.22 7.29979
940 5.09 16 ±0.12 7.641191
960 5.66 11.7 ±0.09 7.747641
1000 7.66 4.65 ±0.035 8.039768
1040 8.3 0.805 ±0.006 8.141162
1100 11.4 0.0981 ±0.00073 8.392152
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected Hot pixel (947, 785),(804, 882),(842, 985),(1136, 3397),(2037, 1) 3000*7+800*2+4000
Bias
Type of defect Location Number of pixels affected Hot pixel (947, 785),(804, 882),(842, 985),(1136, 3397),(2037, 1) 3000*7+800*2+4000
Long exposure dark image
Type of defect Location Number of pixels affected Hot pixel (947, 785),(804, 882),(842, 985),(1136, 3397),(2037, 1) 3000*7+800*2+4000
Readout noise/Conversion factor
Readout speed: 225kps
Conversion Factor= 0.531e-/ADU ±0.001 for 20633.2ADU
RMS noise = 4.1e- ±0.2
Readout speed: 50kps
Conversion Factor= 0.550e-/ADU ±0.001 for 27241.8ADU
RMS noise = 2.7e- ±0.1
Linearity (TDI method)
RMS non linearity (%) = 0.29
Peak to peak non linearity (%)= 0.94
Dark current
Exposure time (s) = 3600
Dark current : 0.4 ± 0.2 e-/hour/pixel
Cosmic event rate : 1.6 ± 0.2 events/min/cm²
Charge Transfer Efficiency (CTE)
Horizontal CTE = 0.9999981
Vertical CTE = 0.9999995
