Preliminary CCD tests
CCD Test report
EEV 44-82
CCD name : Paul
Serial number : 8131-19-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Tested on January 2000
Quantum Efficiency, PRNU
Clock mode: read 350kps LR stripe512
Left readout port
Conversion factor = 1.7743e-/ADU ±0.006 for 24704.6ADU
RMS noise = 4.04 e- ±0.350
CCD temperature : -134.10001Cº
Window area is : X1= 58 X2= 1068 Y1= 8 Y2= 508
Bandwidth 5nm
Long. PRNU rms% QE%
320 1.949 45 ±1.26
330 1.712 49.6 ±1.43
340 1.6 51 ±0.99
350 1.564 53.2 ±0.52
360 1.489 54.9 ±0.54
370 1.346 58.6 ±0.57
380 1.151 66.6 ±0.65
390 1.063 74.2 ±0.76
400 1.026 78 ±0.79
440 0.9685 83.7 ±0.83
460 0.9556 83.6 ±0.83
500 0.934 82.9 ±0.83
540 0.9257 81.6 ±0.82
560 0.9249 80.4 ±0.80
600 0.932 79.1 ±0.78
640 0.9459 77.4 ±0.75
660 0.9571 75.9 ±0.73
700 1.032 71.1 ±0.66
740 1.136 65 ±0.59
760 1.225 61.4 ±0.54
800 1.351 53.9 ±0.46
840 1.478 45.3 ±0.38
900 2.121 28.1 ±0.22
940 2.954 17.1 ±0.13
1000 5.763 4.78 ±0.03
1040 6.619 0.88 ±0.006
1100 9.686 0.109 ±0.0008
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected 3 neighboring traps x=1765 y=1515 3x1500
Bias
Type of defect Location Number of pixels affected Hot pixel x=1816 y=1513 1500
Long exposure dark image
Readout noise/Conversion factor
Clock mode: read 350kps LR stripe512
Left readout port
Conversion factor = 1.7733e-/ADU ±0.006 for 26599.3ADU
RMS noise = 4.171e- ±0.325
Clock mode: read 350kps LR stripe512
Right readout port
Conversion factor = 1.7344e-/ADU ±0.006 for 27101.9ADU
RMS noise = 4.237e- ±0.314
Clock mode: read 166kps LR stripe512
Left readout port
Conversion factor = 1.6353e-/ADU ±0.006 for 26800.7ADU
RMS noise = 3.812e- ±0.244
Clock mode: read 166kps LR stripe512
Right readout port
Conversion factor = 1.6156e-/ADU ±0.006 for 265019.3ADU
RMS noise = 3.904e- ±0.251
Linearity (TDI method)
Not yet performed
Dark current
Not yet available
Charge Transfer Efficiency (CTE)
Readout speed 166kp/s
Horizontal CTE = 0.99999908
Vertical CTE = 0.99999961
