CCD Test report

EEV 44-82
CCD name : Linda
Serial number : 8131-13-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : --

Test on December 1999

Quantum Efficiency, PRNU

      







Left readout port

Readout speed: 350kp/s

Conversion Factor =1.78e-/ADU ± 0.0075  for 24837.24ADU

RMS noise         =4.04e-     ± 0.32



bandwidth = 5nm



Wav.  PRNU rms%  QE%   

310   4.55       37.6

320   4.27       39.7

330   4.10       43.4

340   4.06       45.7

350   4.11       47.9

360   4.08       49.3

370   3.71       55.9

380   2.81       64.7

390   2.22       73.3

400   1.90       77.7

440   1.45       85.0

460   1.37       85.2

500   1.26       84.7

540   1.18       83.0

560   1.15       81.5

600   1.10       79.6

640   1.07       76.9

660   1.07       74.5

700   1.02       68.9

740   1.19       62.0

760   1.18       58.3

800   1.36       49.4

840   1.64       38.9

860   1.70       33.4  

900   2.19       23.0

940   3.42       13.3

960   4.20       9.75

1000  6.46       3.68

1100  8.37       0.05

Cosmetic defects

 

flat field

350nm (UV)

bandwidth: 5nm

 

600 nm

bandwidth: 5nm

Cosmetic defects available here ...

900 nm

bandwidth: 5nm

 

Bias

Long exposure dark image (1 hour @-120C) two port readout.

Type of defect	Location	Number of pixels affected

Bias frame (2 ports)

 

 

Readout noise/Conversion factor

 







Left readout port

Readout speed: 350kp/s

Conversion Factor =1.78e-/ADU ± 0.0075  for 24837.24ADU

RMS noise         =4.04e-     ± 0.32





 

Linearity (TDI method)

Left readout port:

RMS non linearity (%)=0.0206274

Peak to peak non linearity (%)=0.324196



Right readout port:

RMS non linearity (%)=0.0196543

Peak to peak non linearity (%)=0.298219









  

 

 

Dark current

  





 Not measured

  

 

Charge Transfer Efficiency (CTE)

 









Left readout port

Readout speed: 166kp/s

Horizontal CTE = 0.99999987

Vertical CTE =   0.99999948