Preliminary CCD tests

CCD Test report


EEV 44-82
CCD name : Linda
Serial number : 8131-13-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : --

Test on December 1999

 

Quantum Efficiency, PRNU






Left readout port
Readout speed: 350kp/s
Conversion Factor =1.78e-/ADU ± 0.0075 for 24837.24ADU
RMS noise =4.04e- ± 0.32

bandwidth = 5nm

Wav. PRNU rms% QE%
310 4.55 37.6
320 4.27 39.7
330 4.10 43.4
340 4.06 45.7
350 4.11 47.9
360 4.08 49.3
370 3.71 55.9
380 2.81 64.7
390 2.22 73.3
400 1.90 77.7
440 1.45 85.0
460 1.37 85.2
500 1.26 84.7
540 1.18 83.0
560 1.15 81.5
600 1.10 79.6
640 1.07 76.9
660 1.07 74.5
700 1.02 68.9
740 1.19 62.0
760 1.18 58.3
800 1.36 49.4
840 1.64 38.9
860 1.70 33.4
900 2.19 23.0
940 3.42 13.3
960 4.20 9.75
1000 6.46 3.68
1100 8.37 0.05



Cosmetic defects

 

flat field

350nm (UV)

bandwidth: 5nm

 

600 nm

bandwidth: 5nm

Cosmetic defects available here ...

900 nm

bandwidth: 5nm

 

Bias



   

Long exposure dark image (1 hour @-120C) two port readout.





Type of defect Location Number of pixels affected
     
   

Bias frame (2 ports)

 

 

Readout noise/Conversion factor

 



Left readout port
Readout speed: 350kp/s
Conversion Factor =1.78e-/ADU ± 0.0075 for 24837.24ADU
RMS noise =4.04e- ± 0.32


Linearity (TDI method)




Left readout port:
RMS non linearity (%)=0.0206274
Peak to peak non linearity (%)=0.324196

Right readout port:
RMS non linearity (%)=0.0196543
Peak to peak non linearity (%)=0.298219




 

 

Dark current

  


Not measured

 

Charge Transfer Efficiency (CTE)

 




Left readout port
Readout speed: 166kp/s
Horizontal CTE = 0.99999987
Vertical CTE = 0.99999948