Preliminary CCD test
CCD Test report
EEV 44-82
CCD name : Kate
Serial number : 8171-9-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Tested on Feb 2000
Quantum Efficiency, PRNU
Readout speed 350kps
Left readout port
Conversion Factor= 1.785e-/ADU ±0.0060 for 26285.3ADU
RMS noise = 4.41e- ±0.35
CCD temperature : -140Cº
Window area is : X1= 59 X2= 1070 Y1= 11 Y2= 510
Bandwidth 5nm
Wav. PRNU rms% QE%
320 2.501 38.2 ±1.07
330 2.072 42.7 ±1.23
340 1.888 45.8 ±0.89
350 1.828 47.3 ±0.46
360 1.653 49.8 ±0.49
370 1.443 54.8 ±0.54
380 1.208 63.2 ±0.63
390 1.076 70.2 ±0.70
400 0.9971 77.7 ±0.78
420 0.9256 82.5 ±0.83
440 0.916 84.8 ±0.84
460 0.8871 84.7 ±0.71
500 0.8763 84.2 ±0.84
540 0.8258 82.9 ±0.83
560 0.8131 81.5 ±0.81
600 0.7992 79.8 ±0.79
640 0.7833 77.9 ±0.75
660 0.779 76 ±0.73
700 0.8522 71 ±0.66
740 0.9698 64.3 ±0.58
760 1.145 60.6 ±0.54
800 1.187 52.6 ±0.45
840 1.285 43.7 ±0.36
900 1.786 28.3 ±0.22
940 3.366 16.9 ±0.13
1000 6.659 4.49 ±0.033
1040 8.053 0.77 ±0.0057
1100 41.52 0.0911 ±0.00067
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected 3 neighboring traps x=1765 y=1515 3x1500
Bias
Type of defect Location Number of pixels affected Hot pixel x=1816 y=1513 1500
Long exposure dark image : large glowing -> VDD should be reduced to avoid charge injection from the wiping drain.
Readout noise/Conversion factor
Readout speed 166kps
Right readout port
Conversion Factor= 1.679e-/ADU ±0.0050 for 26860.5ADU
RMS noise = 5.54e- ±0.53
Readout speed 166kps
Left readout port
Conversion Factor= 1.663e-/ADU ±0.0059 for 27267.5ADU
RMS noise = 4.09e- ±0.27
Readout speed 350kps
Right readout port
Conversion Factor= 1.822e-/ADU ±0.0063 for 26493.9ADU
RMS noise = 5.63e- ±0.59
Readout speed 350kps
Left readout port
Conversion Factor= 1.785e-/ADU ±0.0060 for 26285.3ADU
RMS noise = 4.41e- ±0.35
Linearity (TDI method)
not done
Dark current
Data to be reduced
Charge Transfer Efficiency (CTE)
Horizontal CTE = 0.99999868
Vertical CTE = 0.99999948
