Preliminary CCD tests

CCD Test report


EEV 44-82
CCD name : Jasmin
Serial number : 8131-18-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : --

Tested on January 2000

 

Quantum Efficiency, PRNU




Conversion factor = 1.7849e-/ADU ±0.006332 for 24770.8ADU
RMS noise = 3.9595e- ±0.2839

Left readout port
Readout speed: 350kp/s

CCD temperature : -140Cº
Window area is : X1= 59 X2= 1071 Y1= 9 Y2= 508
Bandwidth 6nm

Long. PRNU rms% QE%
320 3.3995 41.010 ±1.1109
330 2.8613 45.275 ±1.2576
340 2.5618 47.892 ±0.89849
350 2.3927 48.469 ±0.4565
360 2.2232 50.347 ±0.47931
370 1.8861 53.223 ±0.50485
380 1.4186 61.069 ±0.60343
390 1.1596 63.37 ±0.69192
400 1.0463 76.289 ±0.74216
440 0.96908 82.722 ±0.79684
460 0.94979 82.606 ±0.7999
500 0.93546 81.888 ±0.7495
540 0.92241 81.242 ±0.78625
560 0.92732 80.004 ±0.7685
600 0.93798 78.466 ±0.74785
640 0.96298 76.428 ±0.71936
660 0.98316 73.397 ±0.69643
700 1.0484 68.99 ±0.62598
740 1.1449 63.21 ±0.55622
760 1.1978 59.563 ±0.51844
800 1.4038 50.239 ±0.42566
840 1.442 42.746 ±0.34444
900 1.6423 26.818 ±0.2068
940 1.7097 16.201 ±0.11861
1000 2.6025 4.8735 ±0.032837
1040 5.0149 0.75077 ±0.00559
1100 17.83 0.086777 ±0.00064289



Cosmetic defects

 

flat field

350nm (UV)

 

600 nm

900 nm

Type of defect Location (x,y) Number of pixels affected
trap(x2)   2 neighboring columns

Here find a more accurate description of the defects location .....

Bias



Table not available

Type of defect Location Number of pixels affected
   

Image not available !

Long exposure dark image





Type of defect Location Number of pixels affected
 

Readout noise/Conversion factor

 


Readout speed: 350kp/s
Left readout port
Convertion factor = 1.7847e-/ADU ±0.006252 for 26793.3ADU
RMS noise = 4.1479e- ±0.3288

Readout speed: 350kp/s
Right readout port
Convertion factor = 1.7741e-/ADU ±0.0062 for 26895.6ADU
RMS noise = 4.2195e- ±0.3300

Readout speed: 166kp/s
Left readout port
Conversion factor = 1.6526e-/ADU ±0.005366 for 26936.1ADU
RMS noise = 3.755e- ±0.2476

Readout speed: 166kp/s
Right readout port
Conversion factor = 1.6293e-/ADU ±0.005301 for 27074.5ADU
RMS noise = 3.9424e- ±0.2506



Linearity (TDI method)


Not available



Dark current

  

Not available

 

Charge Transfer Efficiency (CTE)

 


Left readout port
Readout speed: 166kp/s
Horizontal CTE = 0.99999901
Vertical CTE = 0.99999942