Preliminary CCD tests
CCD Test report
EEV 44-82
CCD name : Céline
Serial number : --
Type : Backside, Single layer AR Pixel size 15x15 ?m
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : --
Tested on Jan 2000
Quantum Efficiency, PRNU
Conversion Factor= 1.7493e-/ADU ±0.005047 for 24543.4ADU
RMS noise = 2.8427e- ±0.2152
CCD temperature : -140Cº
Window area is : X1= 56 X2= 1068 Y1= 10 Y2= 508
Bandwidth 6nm
Wav. PRNU rms% QE%
320 2.2115 44.524 ±1.2542
330 1.9036 49.135 ±1.4194
340 1.748 51.815 ±1.0109
350 1.6936 52.644 ±0.51573
360 1.6012 54.434 ±0.53854
370 1.41 58.42 ±0.57627
380 1.1872 66.5 ±0.6571
390 1.0723 74.026 ±0.76027
400 1.0319 77.957 ±0.78943
440 0.96997 83.604 ±0.83753
460 0.96185 83.146 ±0.83452
500 0.93677 82.563 ±0.82797
540 0.92016 81.484 ±0.82009
560 0.91808 80.112 ±0.80032
600 0.9223 78.756 ±0.78045
640 0.93039 77.174 ±0.75195
660 0.93817 75.545 ±0.73177
700 1.0086 70.841 ±0.66196
740 1.1241 64.36 ±0.58484
760 1.1597 60.784 ±0.54368
800 1.224 53.107 ±0.4591
840 1.3694 44.647 ±0.37466
900 1.854 28.623 ±0.23016
940 2.2004 17.023 ±0.13111
1000 2.6336 4.6629 ±0.03501
1040 3.8148 0.83048 ±0.0061835
1100 10.073 0.098401 ±0.00072901
Cosmetic defects
flat field
350nm (UV)
600 nm
900 nm
Type of defect Location (x,y) Number of pixels affected trap 1337, 937 >3000 (Up to the top) trap 1793, 331 >300 (Up to the top)
Bias
Type of defect Location Number of pixels affected no defect
Long exposure dark image
Measurments not available
Type of defect Location Number of pixels affected
Readout noise/Conversion factor
Readout speed :350kp/s
Conversion Factor= 1.7493e-/ADU ±0.005047 for 24543.4ADU
RMS noise = 2.8427e- ±0.2152
CCD temperature : -140Cº
Window area is : X1= 56 X2= 1068 Y1= 10 Y2= 508
Linearity (TDI method)
Measurments not available
Dark current
Measurments not available
Charge Transfer Efficiency (CTE)
Readout speed :166kp/s
Horizontal CTE = 0.999999474616504
Vertical CTE = 0.999999810227981
