Preliminary CCD tests

CCD Test report


EEV 44-82
CCD name : Bruce
Serial number : 7173-3-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science

Tested on March 2000

 

Quantum Efficiency, PRNU



Clock mode: read 350kps LR stripe512
Conversion Factor= 1.8586e-/ADU ±0.006116 for 23011.2ADU
RMS noise = 4.0441e- ±0.3508

CCD temperature : -140Cº


Window area is : X1= 59 X2= 1066 Y1= 9 Y2= 510
Bandwidth 5nm

Wav. PRNU rms% QE%
320 1.7 60.8 ±1.7
330 1.5 67.5 ±1.9
340 1.4 71.9 ±1.4
350 1.4 74.0 ±0.7
360 1.4 77.6 ±0.7
370 1.3 82.0 ±0.8
380 1.1 86.3 ±0.8
390 1.0 90.3 ±0.9
400 0.9 91.5 ±0.9
420 0.8 92.2 ±0.9
440 0.8 92.1 ±0.9
460 0.7 90.4 ±0.9
500 0.7 88.2 ±0.8
540 0.7 85.7 ±0.8
560 0.7 84.1 ±0.8
600 0.7 81.9 ±0.8
640 0.7 79.6 ±0.7
660 0.7 77.5 ±0.7
700 0.9 71.5 ±0.6
740 1.0 65.2 ±0.5
760 1.2 61.7 ±0.5
800 1.6 54.3 ±0.4
840 2.1 43.9 ±0.3
900 2.5 26.6 ±0.2
940 3.9 16.1 ±0.12
1000 7.5 4.65 ±0.03
1040 8.1 0.8 ±0.005
1100 11.7 0.09 ±0.0006



Cosmetic defects

flat field

350nm (UV), bandwidth 5nm

invalid link: /sci/facilities/develop/detectors/optdet/CCDtestbench/EEV/Bruce/ImagesMeasurement/Flat350nm.jpg
High level

invalid link: /sci/facilities/develop/detectors/optdet/CCDtestbench/EEV/Bruce/ImagesMeasurement/FlatLowLevel350nm.JPG
Low level

 

600 nm, bandwidth 5nm


High level

invalid link: /sci/facilities/develop/detectors/optdet/CCDtestbench/EEV/Bruce/ImagesMeasurement/FlatLowLevel600nm.JPG
Low level

 

900 nm, bandwidth 5nm


High level

invalid link: /sci/facilities/develop/detectors/optdet/CCDtestbench/EEV/Bruce/ImagesMeasurement/FlatLowLevel900nm.JPG
Low level invalid link: /sci/facilities/develop/detectors/optdet/CCDtestbench/EEV/Bruce/ImagesMeasurement/sFlatLowLevel900nm.JPG

Type of defect Location (x,y) Number of pixels affected
Hot pixel x=1680, y=1466 2500*3

Bias

Type of defect Location Number of pixels affected
Hot pixel x=1680, y=1466 2500*3
 

Long exposure dark image

A glowing in the top is visible, nothing related with amplifier glowing. It looks like charge injection on the top of the device 

Cross section of this effect (ADUs):
Type of defect Location Number of pixels affected
Hot pixel x=1680, y=1466 2500*3
Glowing Upper left ----
Readout noise/Conversion factor


Read out speed: 166kps
Left readout port
Conversion Factor= 1.722e-/ADU ±0.006 for 27149.6ADU
RMS noise = 3.84e- ±0.28

Readout speed: 166kps
Right readout port
Conversion Factor= 1.721e-/ADU ±0.006 for 27065.1ADU
RMS noise = 4.19e- ±0.30

Read out speed: 350kps
Left readout port
Conversion Factor= 1.867e-/ADU ±0.006 for 26889.9ADU
RMS noise = 4.08e- ±0.35

Read out speed: 350kps
Right readout port
Conversion Factor= 1.864e-/ADU ±0.006 for 26832.2ADU
RMS noise = 4.58e- ±0.39


Linearity (TDI method)

not done

Dark current

not done

Charge Transfer Efficiency (CTE)




Horizontal CTE = 0.9999988
Vertical CTE = 0.9999997