Preliminary CCD tests

CCD Test report


EEV 44-82
CCD name : Antonio
Serial number : 7243-11-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : ---

 

Tested on Sept2000

Quantum Efficiency, PRNU




Readout speed: 225kps
Conversion Factor= 0.547e-/ADU ±0.002 for 19844.3ADU
RMS noise = 4.0e- ±0.2

CCD temperature : -135.10001Cº


Window area is : X1= 64 X2= 2091 Y1= 12 Y2= 505
Bandwidth 5nm

Wav. QE% PRNU rms% Phase=
320 52 ±1.5 2.27 6.125997
330 58.6 ±1.7 2.11 6.028146
340 63 ±1.2 2.12 6.030178
350 65.7 ±0.64 2.13 6.038196
360 70.1 ±0.69 2.13 6.036355
370 76.9 ±0.76 2.02 5.960715
380 83.4 ±0.82 1.85 5.852493
390 88.5 ±0.91 1.74 5.773544
400 90.2 ±0.92 1.68 5.722613
420 92 ±0.93 1.6 5.658869
440 92.3 ±0.92 1.64 5.71878
460 91.2 ±0.92 1.52 5.599422
480 89.3 ±0.9 1.52 5.616957
500 88.9 ±0.89 1.46 5.56632
520 87.7 ±0.88 1.48 5.605516
540 86.1 ±0.87 1.46 5.604696
560 84.1 ±0.84 1.44 5.60359
580 83.4 ±0.83 1.43 5.607141
600 81.8 ±0.81 1.41 5.612066
620 80.6 ±0.79 1.41 5.623606
640 79.2 ±0.77 1.37 5.601625
660 76.7 ±0.74 1.42 5.65966
680 74.4 ±0.71 1.5 5.735599
700 71.4 ±0.67 1.6 5.818209
720 68.8 ±0.63 1.7 5.890136
740 65.6 ±0.6 1.77 5.93051
760 61.8 ±0.55 1.67 5.862796
780 57.8 ±0.51 1.84 5.974855
800 52 ±0.45 1.77 5.933493
820 46.5 ±0.4 1.97 6.048335
840 41.2 ±0.35 2.36 6.245497
860 36.6 ±0.31 2.45 6.282308
880 31.9 ±0.26 2.61 6.341496
900 27.2 ±0.22 2.59 6.330776
920 22 ±0.17 3.33 6.605219
940 17.1 ±0.13 4.71 6.942351
960 12.6 ±0.097 5.69 7.097695
980 8.44 ±0.064 6.92 7.24597
1000 5.09 ±0.038 8.24 7.400656
1040 0.911 ±0.0068 8.18 7.428894
1100 0.116 ±0.00086 13.9 7.660152




Cosmetic defects

 

flat field

350nm (UV), bandwidth 5nm


High level


Low level

 

600 nm, bandwidth 5nm


High level


Low level

 

900 nm, bandwidth 5nm


High level


Low level

Type of defect Location (x,y) Number of pixels affected
Hot pixel (539, 2238),(585, 2347),(936, 1862),(104, 2616) 7000

 

 

Bias





Type of defect Location Number of pixels affected
Hot pixel (539, 2238),(585, 2347),(936, 1862),(104, 2616),(523, 2122) 9000
   

Long exposure dark image

Type of defect Location Number of pixels affected
Hot pixel (539, 2238),(585, 2347),(936, 1862),(104, 2616),(523, 2122) 9000
 




Readout noise/Conversion factor

 




Readout speed: 225kps
Conversion Factor= 0.545e-/ADU ±0.001 for 21329ADU
RMS noise = 4.0e- ±0.2

Readout speed: 50kps
Conversion Factor= 0.565e-/ADU ±0.001 for 27211.2ADU
RMS noise = 2.6e- ±0.1




Linearity (TDI method)



RMS non linearity (%) = 0.08
Peak to peak non linearity (%)= 0.58








Dark current

  


Exposure time (s) = 3600
Dark current : 0.7 ± 0.01 ADU
Dark current : 0.39 ± 0.05 e-/hour/pixel

Charge Transfer Efficiency (CTE)

 

Horizontal CTE = 0.999994
Vertical CTE = 0.999997