Preliminary CCD tests
CCD Test report
EEV 44-82
CCD name : Annie
Serial number : 8171-4-1
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of outputs : 2
Overall rating : Science
Tested on Feb 2000
Quantum Efficiency, PRNU
Clock mode: read 350kps LR stripe512
Conversion factor = 1.8725e-/ADU ±0.006547 for 23312.2ADU
Bruit RMS = 4.6123e- ±0.4067
CCD temperature : -140Cº
Window area is : X1= 58 X2= 1069 Y1= 8 Y2= 508
Bandwidth 5nm
Long. PRNU rms% QE%
320 2.959 36.9 ±1.04
330 2.4 41.4 ±1.19
340 2.185 44.3 ±0.86
350 2.122 45.7 ±0.44
360 2.018 48.2 ±0.47
370 1.763 53.2 ±0.52
380 1.403 62.6 ±0.61
390 1.209 71 ±0.72
400 1.123 75.8 ±0.76
420 1.022 80.6 ±0.81
440 0.9887 83.1 ±0.83
460 0.9485 83.2 ±0.83
500 0.8975 83 ±0.83
540 0.8588 81.7 ±0.82
560 0.8398 80.5 ±0.80
600 0.8132 79.2 ±0.78
640 0.7828 77.5 ±0.75
660 0.768 76 ±0.73
700 0.7956 71.6 ±0.66
740 0.8697 65.8 ±0.59
760 0.9666 61.6 ±0.55
800 0.9638 52.9 ±0.45
840 1.108 43.7 ±0.36
900 1.176 28.8 ±0.23
940 1.999 17.9 ±0.13
1000 4.978 4.91 ±0.036
1040 7.704 0.783 ±0.0058
1100 53.81 0.0937 ±0.00069
Cosmetic defects
flat field
350nm (UV), bandwidth 5nm
High level
Low level
600 nm, bandwidth 5nm
High level
Low level
900 nm, bandwidth 5nm
High level
Type of defect Location (x,y) Number of pixels affected 3 neighboring traps x=1765 y=1515 3x1500
Bias
Type of defect Location Number of pixels affected Hot pixel x=1816 y=1513 1500
Long exposure dark image (a single frame showing cosmic rays). ! Beware ! VDD (Drain) must be 11V and VDR = 24 V (otherwise huge Glowing)
Readout noise/Conversion factor
Clock mode: read 350kps LR stripe512
Facteur de convertion1.8746e-/ADU ±0.005688 pour 27056ADU
Bruit RMS= 4.2802e- ±0.3785
Linearity (TDI method)
Clock mode: read 350kps LR stripe512
Left readout port
RMS non linearity (%) = 0.079
Peak to peak non linearity (%)= 0.332
Dark current
Not yet measured
Charge Transfer Efficiency (CTE)
Readout speed 166kp/s
Horizontal CTE = 0.99999908
Vertical CTE = 0.99999961
