Sorry! This page is not yet available in your preferred language, so we're displaying the original version instead.
CCD wafer
CCD under inspection at the detector lab at the ESO Headquarters in Garching. This image was obtained in 1997.
Kredit:ESO/H.H.Heyer
O snímku
Id: | ccd-wafer_jun1997 |
Typ: | Fotografický |
Datum zveřejnění: | 3. prosince 2009 23:18 |
Velikost: | 5079 x 3390 px |
O objektu
Jméno: | ESO HQ Garching |
Typ: | Unspecified : Technology : Observatory : Facility Unspecified : Technology : Observatory : Instrument |
Kategorie: | Premises |