Quality Control and
Data Processing

HC PLOTS
counts in brightest CI flat
counts in brightest DBI flat
counts in brightest DPI flat
counts in brightest LSS flat
room mean square of CI master flat
room mean square of DBI master flat
room mean square of DPI master flat
room mean square of LSS master flat
fixed pattern noise in CI mode
fixed pattern noise in DBI mode
fixed pattern noise in DPI mode
fixed pattern noise in LSS mode
number of bad pixel in CI mode
number of bad pixel in DBI mode
number of bad pixel in DPI mode
number of bad pixel in LSS mode
QC1 database (advanced users): browse | plot

The IRDIS arm is operated in four modes:

• CI: classical imaging, the dual beam filter ( INS1.OPTI2.NAME ) is CLEAR
• DBI: dual beam imaging, the dual beam filter ( INS1.OPTI2.NAME ) is one of D_Y23, D_J23, D_H23 or D_K12.
• DPI: differential polarimetric imaging, the dual beam filter ( INS1.OPTI2.NAME ) is one of P0-90, P45-135
• LSS: long slit spectroscopy is flatfielded with imaging flats with dual beam filter=CLEAR and common beam filter being one of W_YJH and W_YHJKs

IRDIS lamp flats are acquired during daytime. The template generates five raw frames with increasing countrate

IRDIS CI master flat using common filter wheel B_H filter and no filter in the dual beam filter wheel

IRDIS DBI raw flat (last in the sequence with highest flux), using common filter wheel B_Ks filter and dual beam filter D_K12.

IRDIS DBI master flat, using common filter wheel B_Ks filter and dual beam filter D_K12.

QC1_parameters

FITS key	QC1 database: table, name	definition	class*	HC_plot**	more docu
[derived from QC procedure]	sphere_irdis_flat..qc_adu_left_4	counts in the fifth exposure	HC		[docuSys coming]
[derived from QC procedure]	sphere_irdis_flat..qc_adu_right_4	counts in the fifth exposure	HC		[docuSys coming]
*Class: KPI - instrument performance; HC - instrument health; CAL - calibration quality; ENG - engineering parameter **There might be more than one.

Trending

The counts in the brightest flat (the fifth raw flat) is monitored. More precisely, the QC script takes the last raw frame generated by the template (which is the brighest frame with the longest DIT) and the first plane of NAXIS3 = 40 = NDIT planes. Of this plane the median counts in a central 80x80 pixel large window is taken, for the left and the right channel center individually. For all four modes (CLI, DBI, DPI and LSS) in the same way.

• for mode CI for the four broad band filters B_Y, B_J, B_H and B_Ks.
• for mode DBI for dual band filters D_H23 and D_K12 for the left and the right optical path separately.
• for mode >DPI for the four broad band filters and the 0-90 optical setup the left and the right optical path separately.
• for the rarely used mode LSS for the W_YJH and W_YJHKs the right and the left channe;l separately

Scoring&thresholds IRDIS Flat counts

All counts are scored. Relaxed thresholds are used. The plot shows the counts in one plane of the raw frame cube corresponding to NDIT=1. For NDIT=40, the total counts in the brightest raw flat is 40 times the counts of one plane of the raw frame cube. To achieve a S/N-ratio = 200 in the brightest raw flat, about 1000 ADU must be achieved in a single plane. The S/N ratio in the final master flat (derived from the illuminated regions alone) is not provided by the pipeline.

History

Date	event
2018-06	lamp counts begin to decrease
2018-07-29T16:28	LAMP_QL1 is used instead of LAMP_QL2

Algorithm IRDIS Flat counts

COUNTS_LEFT is the median counts of the last raw frame of the sequence in the region [440 490 520 570].
COUNTS_RIGHT is the median counts of the last raw frame of the sequence in the region [1440 490 1520 570].

QC1_parameters

FITS key	QC1 database: table, name	definition	class*	HC_plot**	more docu
[derived from QC procedure]	sphere_irdis_flat..qc_rms_left	left channel rms	HC		[docuSys coming]
[derived from QC procedure]	sphere_irdis_flat..qc_rms_right	right channel rms	HC		[docuSys coming]
*Class: KPI - instrument performance; HC - instrument health; CAL - calibration quality; ENG - engineering parameter **There might be more than one.

Trending

The RMS of the master flat is monitored for CI, DPI and LSS to check for cosmetics and potential vignetting.

Scoring&thresholds IRDIS RMS of master flat

The master flat RMS is scored for CI, DPI and LSS modes. Relaxed thresholds are used.

History

No remarks.

Algorithm IRDIS RMS of master flat

It is the RMS of the master flat

QC1_parameters

FITS key	QC1 database: table, name	definition	class*	HC_plot**	more docu
[derived from QC procedure]	sphere_irdis_flat..qc_fpn_left	left channel fpn	HC		[docuSys coming]
[derived from QC procedure]	sphere_irdis_flat..qc_fpn_right	right channel fpn	HC		[docuSys coming]
*Class: KPI - instrument performance; HC - instrument health; CAL - calibration quality; ENG - engineering parameter **There might be more than one.

Trending

The fixed pattern noise of the master flat is monitored for CI, DPI and LSS.

Scoring&thresholds IRDIS Fixed-pattern noise of master flat

The master flat RMS is scored for CI, DPI and LSS modes. Relaxed thresholds are used.

History

No remarks.

Algorithm IRDIS Fixed-pattern noise of master flat

The value is the fixed-pattern noise (the pixel-to-pixel response ratios) of the detector derived from the master flat.

QC1_parameters

FITS key	QC1 database: table, name	definition	class*	HC_plot**	more docu
QC NUM BADPIXELS	sphere_irdis_flat..qc_num_badpix	number of bad pixel	HC		[docuSys coming]
*Class: KPI - instrument performance; HC - instrument health; CAL - calibration quality; ENG - engineering parameter **There might be more than one.

Trending

The number of bad pixel is monitored for CI, DBI and LSS. This parameter is for both channels (left and right) together.

Scoring&thresholds IRDIS Bad pixel number

The scoring thresholds are based on statistical grounds.

History

No remarks.

Algorithm IRDIS Bad pixel number

The number of bad pixel is composed of the number of static bad pixel derived from the submitted static bad pixel map plus the dynamic bad pixel, which are those pixel deviating a configurable fraction from the mean linearity.