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QC
PLOTS |
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CURRENT |
HISTORY |
CI counts in high flux raw flat |
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CI rms of master flat |
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CI fixed pattern noise |
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CI number of bad pixel |
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DBI counts in high flux raw flat |
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DBI rms of master flat |
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DBI fixed pattern noise |
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DBI number of bad pixel |
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QC1
database (advanced users): browse
| plot |
Click on CURRENT
to see the current trending (Health Check).
Click on HISTORY
to see the historical evolution of the trending. |
The IRDIS arm is operated in four modes:
- CI: classical imaging, the dual beam filter ( INS1.OPTI2.NAME ) is CLEAR
- DBI: dual beam imaging, the dual beam filter ( INS1.OPTI2.NAME ) is one of D_Y23, D_J23, D_H23 or D_K12.
- DPI: differential polarimetric imaging, the dual beam filter ( INS1.OPTI2.NAME ) is one of P0-90, P45-135
- LSS: long slit spectroscopy is flatfielded with imaging flats with dual beam filter=CLEAR and common beam filter being one of W_YJH and W_YHJKs
IRDIS lamp flats are acquired during daytime. The template generates five raw frames with increasing countrate.
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IRDIS CI master flat using common filter wheel B_H filter and no filter in the dual beam filter wheel |
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IRDIS DBI raw flat (last in the sequence with highest flux), using common filter wheel B_Ks filter and dual beam filter D_K12. |
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IRDIS DBI master flat, using common filter wheel B_Ks filter and dual beam filter D_K12. |
top
counts, cosmetics, fixed pattern noise |
QC parameters come per common filter, dual beam filter and per beam (left, right).
QC1 parameters
parameter |
QC1 database: table, name
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procedure |
counts |
sphere_irdis_flat, qc_flux_left_4, qc_flux,right_4 |
median counts in the fifth (most bright) raw flat frame of the sequence of five raw frames with increasing exposure time |
RMS of the master flat |
sphere_irdis_flat, qc_rms_left, qc_rms_right |
RMS of the master flat to monitor detector cosmetics and vignetting |
fixed pattern noise |
sphere_irdis_flat, qc_fpn_left, qc_fpn_right |
fixed pattern noise |
number of bad pixel |
sphere_irdis_flat, qc_num_badpix |
number of bad pixel in the whole FOV (covering both beams) |
Trending
For IRDIS modes DPI and LSS only a subset of QC parameters is monitored.
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