TESTD/CCD

The command does a series of tests on a catalogue of dark frames and produces:

• An estimate of the electron analogue-to-ADU conversion factor;
• A map of dark current across the CCD.

The command uses the bias offset that is expected in the keyword BIASMEAN which is produced by the command TESTB/CCD. Alternatively, the user can store the name of the combined bias frame created by the command TESTB/CCD in the keyword BIASMEAN.