QC documentation system: QC procedure wave_red.prg for UVES

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bias_blue.prg bias_red.prg dark_blue.prg dark_red.prg zeroflat.prg
fmtcheck_blue.prg fmtcheck_red.prg orderdef_blue.prg orderdef_red.prg flat_blue.prg flat_red.prg wave_blue.prg wave_red.prg
std_blue.prg std_red.prg
fmtcheck_fib.prg orderdef_fib.prg sflat_fib.prg fflat_fib.prg wave_fib.prg
 
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NAME wave_red.prg
VERSION 2.5
SYNTAX MIDAS
CALL from $DFS_PRODUCT/BIAS_RED/$DATE:
uves.MeasureQuality -a <AB> -c wave_red.prg [-i|--NOingestQC1pars]
where
  • <AB> is the Association Block
  • [-i] forces QC1 parameter ingestion (default)
  • [--NOingestQC1pars] prevents QC1 parameter ingestion
INSTRUMENT UVES
RAWTYPE WAVE_ECH_RED
PURPOSE Comparison of raw, master and/or reference WAVE_ECH_RED files for UVES QC assessment; QC1 values are calculated and fed into the QC1 table. QC1 plot(s) and/or display(s) are generated, and later reviewed within certifyProducts.
The generated plots stored in $DFO_PLT_DIR/$DATE with the name r.<DPid>_tpl_0000.fits.png where <DPid> is the Data Product Identification of the first frame of the template.
PROCINPUT RAW frame from AB; LINE_TABLE_RED[U|L](s) products (the MIDAS version of the PL produced three LINE_TABLE_RED[U|L] products (LINE_TABLE_RED[U|L]1, LINE_TABLE_RED[U|L]2 & LINE_TABLE_RED[U|L]3, this script still copes with both flavours)
QC1TABLE trending | table(s) in QC1 database:
uves_wave
TRENDPLOT trending | HealthCheck plot(s) associated to this procedure:
HEALTH/trend_report_ECH_RESOLUTION_DHC_HC.html
QC1PAGE trending | associated documentation:
wave_qc1.html
QC1PLOTS
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wave_ech_red.montage.png
A montage image made up of the following individual reports simply for the purposes of easier/better display in XV during the certification process. Created together with the reference montage (see below) within the uves.MeasureQuality script. Can be recreated manually by calling the script uves.makeQCreportMontage -a <AB>, see uves.makeQCreportMontage -h for more details.
wave_ech_red.montage.ref.png
A montage image made up from the individual QC reports of the reference AB located by the script uves.getRefAB. During certification, the two montage images are blinked to facilitate identification of unusual features. This reference montage created at the same time as the AB montage (see above).The montage of the reference AB is easily identified during the blinking as the one with the grey background.
wave_ech_red_0000.fits.png
box 1, left to right, top to bottom:
plot 1:trace across the middle row of the UPPER chip RAW frame
plot 2:trace across the middle column of the RAW frames (ie both chips 'stuck together')
plot 3:trace across the middle row of the LOWER chip RAW frame
plot 4:measured resolving power of each line used in the solution for the UPPER chip as a function of X
plot 5:measured resolving power of each line used in the solution for the LOWER chip as a function of X
box 2, top to bottom:
plot 6:residuals of measured line positions with respect to the physical model for the UPPER chip for the order centre (red open circles) and the two so-called sky traces (one on either side of the central trace) (green and blue crosses) as a function of X pixels coordinate
plot 7:residuals of measured line positions with respect to the physical model for the LOWER chip for the order centre (red open circles) and the two so-called sky traces (one on either side of the central trace) (green and blue crosses) as a function of X pixels coordinate
plot 8:residuals of measured line positions with respect to the physical model for the UPPER chip for the order centre (red open circles) and the two so-called sky traces (one on either side of the central trace) (green and blue crosses) as a function of order number
plot 9:residuals of measured line positions with respect to the physical model for the LOWER chip for the order centre (red open circles) and the two so-called sky traces (one on either side of the central trace) (green and blue crosses) as a function of order number
box 3, top to bottom:
plot 10:pixel-space representation of found but not used (black) and found and used (red) in the solution lines as a function of order for the UPPER chip
plot 11:pixel-space representation of found but not used (black) and found and used (red) in the solution lines as a function of order for the UPPER chip
wave_ech_red_0000.fits_1.ima.png
MIDAS display of the RAW frame (both chips) with the located emission lines indicated by filled circle symbols
wave_ech_red_0000.fits_2.ima.png
closeup of MIDAS display of the LOWER chip RAW frame with the located emission lines indicated by filled circle symbols
wave_ech_red_0000.fits_3.ima.png
closeup of MIDAS display of the UPPER chip RAW frame with the located emission lines indicated by filled circle symbols
QC1PARAM QC1 parameters written into QC1 table:
QC1db names: lambda_min | lambda_max | order_min | order_max | order_min_det | order_max_det | resid_avg | resid_rms | resol_med | resol_rms | fwhm_med | fwhm_rms | nlin_tot | nlin_res | nlin_sel | nlin_sol | nlin_tot_1stiter | nlin_niters | nlin_int | int_avg | ins_temp4_mean
FITS key names: QC.WLENMIN | QC.WLENMAX | QC.ORDMIN | QC.ORDMAX | QC.ORDMAX | QC.ORDMIN.DETECTED | QC.ORDMAX.DETECTED | QC.LINE.RESIDAVG | QC.LINE.RESIDRMS | QC.RESOLMED | QC.RESOLRMS | QC.FWHMMED | QC.FWHMRMS | QC.NLINTOT | QC.NLINRES1 | QC.NLINSEL | QC.NLINSOL | QC.TRACE0.WIN2.NLINDET1 | QC.TRACE0.WIN2.NLINDET.NITERS | QC.NLININT | QC.INTAVG | INS.TEMP4.MEAN
QC1 params created by pipeline: All
QC1 params created by this procedure: None
ALGORITHM Description of algorithms:
Algorithms for pipeline created keywords are (in principal) described in the pipeline user's manual
  • lambda_min: minimum wavelength [Angstrom], product keyword QC.WLENMIN
    Description: minimum wavelength
  • lambda_max: maximum wavelength [Angstrom], product keyword QC.WLENMAX
    Description: maximum wavelength
  • order_min: minimum order number, product keyword QC.ORDMIN
    Description: minimum order number expected
  • order_max: maximum order number, product keyword QC.ORDMAX
    Description: maximum order number expected
  • order_min_det: minimum order number, product keyword QC.ORDMIN.DETECTED
    Description: minimum order number detected
  • order_max_det: maximum order number, product keyword QC.ORDMAX.DETECTED
    Description: maximum order number detected
  • resid_avg: mean residual of line positions to fit [milli-A], product keyword QC.LINE.RESIDAVG
    Description: Parameter useful to check precision of wavelength calibration solution. We use picometer units at it comes out a very small number.
  • resid_rms: sigma of residual of line positions to fit [milli-A], product keyword QC.LINE.RESIDRMS
    Description: Parameter useful to check precision of wavelength calibration solution We use picometer units at it comes out a very small number.
  • resol_med: median resolving power of lines selected, product keyword QC.RESOLMED
    Description: measured median resolving power of lines selected
  • resol_rms: sigma of resolving power of lines selected, product keyword QC.RESOLRMS
    Description: measured average resolving power of lines selected
  • fwhm_med: median FWHM in X of lines selected, product keyword QC.FWHMMED
    Description: measured median FWHM in x of lines selected
  • fwhm_rms: sigma of FWHM in X of lines selected, product keyword QC.FWHMRMS
    Description: measured standard deviation of FWHM in x of lines selected
  • nlin_tot: total number of lines found, product keyword QC.NLINTOT
    Description: number of lines found
  • nlin_res: number of lines with residuals < 0.1, product keyword QC.NLINRESi
    Description: No of lines with residual < 0.1 nm. These are residuals with value less than 0.1 nm. This number gives an idea of the precision of the final solution. The higher the number the more precise is the solution.
  • nlin_sel: number of lines selected, product keyword QC.NLINSEL
    Description: number of lines which could be cross-identified with the catalogue
  • nlin_sol: number of lines used in solution, product keyword QC.NLINSOL
    Description: number of lines identified and accepted for determining the final wavelength calibration solution
  • nlin_tot_1stiter: number of lines detected in first iteration search, product keyword QC.TRACE0.WIN2.NLINDET1
    Description: The PL automtically adjusts the line detection threshold iteratively until it detects a number of lines between the --minlines and --maxlines command line parameters (see esorec --man uves_cal_wavecal). The nlin numbers above are those of the final iteration. This is the number of lines detected in the FIRST iteration, and so is less sensitive to pipeline artifacts.
  • nlin_niters: number of lines used threshold adjustment iterations required to arrive at final solution, product keyword QC.TRACE0.WIN2.NLINDET.NITERS
    Description: number of lines used threshold adjustment iterations required to arrive at final solution
  • nlin_int: number of lines selected in ThAr intensity check, product keyword QC.NLININT
    Description: To monitor ThAr intensity we measure the average intensity of a selected line list.
  • int_avg: average intensity of ThAr lines (divided by EXPTIME), product keyword QC.INTAVG
    Description: To monitor ThAr intensity we measure the average intensity of a selected line list.
  • ins_temp4_mean: average temperature inside air [C] , product keyword INS.TEMPi.MEAN
    Description: Mean Temperature during the exposure.
CERTIF Reasons for rejection:
  • Too little light
  • Severe Saturation, there will often be some saturation in some lines which is fine, but if most lines were saturated such that too few non saturated lines could be found (never actually seen in 'recorded history' of normal operatiuons)
  • Insufficient lines in solution
  • mean residuals too large
  • Resolving power out of specificaition
COMMENTS The threshold adjustment iteration algorithm can play havoc with the QC1 parameters. A tiny change in flux level can result in transitioning from, say, 3 to 2 iterations which can then result in large changes in number of lines found/used, minimum and maximum wavelengths, even number of orders found in solution, and somehow such changes also seem to affect the measured resolution and residual rms.
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