This documentation is intended both for QC scientists and SciOps astronomers (who may want to ignore the technical information displayed in grey).
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NAME |
qc_IMG_FLAT.sh
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VERSION |
1.0 -- 2006-07-20 fill template by handbook
1.1 -- 2006-07-28 LW-SW twflats included in docu
1.2 -- 2008-04-21 writeQC to replace get_QC1 and call_qc1_twflat and call_qc1_twflat_oe
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SYNTAX |
SHELL
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CALL |
called by processQC as qc_IMG_FLAT -d $DATE -f $primfile
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INSTRUMENT |
ISAAC
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RAWTYPE |
IMG_FLAT
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PURPOSE |
a) calculates post-pipeline parameters
b) generates QC report
c) writes QC1 parameters into local list
The script reads the OCS.SELECT-ARM
(arm of instrument) and calls one IMG_FLAT_1pro.sh,
that handles all three cases: SW-arm, LW-arm jitter, LW-arm chopping.
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PROCINPUT |
a) $DATE in yyyy-mm-dd,
b) $primfile is the PRO.CATG=MASTER_IMG_FLAT product with the _0000.fits extension.
c) raw frames are implicitely read from the AB.
d) Reference MASTER_IMG_FLAT are implicitely read from $DFO_QC_DIR/references.
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QC1TABLE |
trending | table(s) in QC1 database:
isaac_twflat
isaac_twflat_oe
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TRENDPLOT |
trending | HealthCheck plot(s) associated to this procedure:
trend_report_TWFLAT_STAT_HC.html |
trend_report_TWFLAT_OPE_HC.html |
trend_report_TWFLAT_DIFF_FPN_HC.html |
trend_report_TWFLAT_OE_HC.html |
trend_report_TWFLAT_LTAT_HC.html |
trend_report_TWFLAT_OPE_LW_HC.html |
trend_report_TWFLAT_DIFF_FPN_LW_HC.html |
trend_report_TWFLAT_OE_LW_HC.html
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QC1PAGE |
trending | associated documentation:
qc_IS_twflat.html
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QC1PLOTS
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twflat0.png
display MASTER_IMG_FLAT for Hawaii array with TwFlat template
twflat1.png
display MASTER_IMG_FLAT_ERRMAP on RTD.
twflat2.png
display BAD_PIXEL_MAP on RTD
twflat3.png
UL: The mean (collapsed) column (red) and the column at X=1024/4 of the product frame.
UC: Two rows at Y=1024/4 (red) and Y=1024*(3/4) (blue) of the product frame
UR: flux evolution within the raw frame stack.
LL: Zoom of UC
LC: The Y=500 row of the product minus the Y=500 row of a reference
product. Y=600 row of the product minus the Y=600 row of a reference
product. X=500 column of the master minus the X=500 column of a
reference product. The reference product is renewed usually once a
period or after an intervention.
LR: Jitter trace on the sky in pixel
twflat4.png
Histogram of the MASTER_IMG_FLAT product per quadrant, initial Gaussian guess and final fit.
Sigma of the final fit is the fixed pattern noise (structural noise).
twflat5.png
Noise per flux diagram per quadrant of raw frame stack.
The fluxes of the odd and the ven columns are given separately
showing odd-even column effects.
twflat6.png
Twice the flux of the odd columns devided by the flux of all column (red)
per quadrant and all raw frames of the stack.
Twice the flux of the even columns devided by the flux of all column (green)
per quadrant and all raw frames of the stack.
Horizontal lines (zero slope) mean a constant effect; can be flatfielded out.
Values around 1.0004 are ok; Intervention limit is 1.02 .
twflat7.png
As twflat6.png, but red is current OE column effect, blue is
most recent OE column effect and black is second last OE column effect.
twflat10.png
As twflat0.png, but for LW-arm J+Block filter
twflat11.png
As twflat1.png, but for LW-arm J+Block filter
twflat12.png
As twflat2.png, but for LW-arm J+Block filter
twflat13.png
As twflat3.png, but for LW-arm J+Block filter
twflat14.png
As twflat4.png, but for LW-arm J+Block filter
twflat15.png
As twflat5.png, but for LW-arm J+Block filter
twflat16.png
As twflat6.png, but for LW-arm J+Block filter
twflat17.png
As twflat7.png, but for LW-arm J+Block filter
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QC1PARAM |
QC1 parameters written into QC1 table:
FITSNAME, DBNAME , typical value, description:
post pipeline script QC1 parameters
QC.UL.FPN ,diff_fpn_UL UL quadrant FPN from Gaussian fit to histogram of master devided by reference frame
QC.LL.FPN ,diff_fpn_LL LL quadrant FPN from Gaussian fit to histogram of master devided by reference frame
QC.UR.FPN ,diff_fpn_UR UR quadrant FPN from Gaussian fit to histogram of master devided by reference frame
QC.LR.FPN ,diff_fpn_LR LR quadrant FPN from Gaussian fit to histogram of master devided by reference frame
NONE ,std_LL, std in window of LL quadrant of MASTER_IMG_FLAT
NONE ,tot_LL, tot in window of LL quadrant of MASTER_IMG_FLAT
NONE ,std_UL, std in window of UL quadrant of MASTER_IMG_FLAT
NONE ,tot_UL, tot in window of UL quadrant of MASTER_IMG_FLAT
NONE ,std_LR, std in window of LR quadrant of MASTER_IMG_FLAT
NONE ,tot_LR, tot in window of LR quadrant of MASTER_IMG_FLAT
NONE ,std_UR, std in window of UR quadrant of MASTER_IMG_FLAT
NONE ,tot_UR, tot in window of UR quadrant of MASTER_IMG_FLAT
pipeline
QC.TWFLAT.MEDMIN ,qc_twflat_medmin, minimum of raw stack medians
QC.TWFLAT.MEDMAX ,qc_twflat_medmax, maximum of raw stack medians
QC.TWFLAT.MEDAVG ,qc_twflat_medavg, average of raw stack medians
QC.TWFLAT.MEDSTDEV ,qc_twflat_medstdev, stdev of raw stack medians
QC.TWFLAT.NBADPIX ,badpix, number of bad (non-linear) pixel
QC.ODDEVEN.ULMEAN ,oc_UL_mean, mean of odd even column effect in UL quadrant
QC.ODDEVEN.ULSTDEV ,oc_UL_stdev, mean of odd even column effect in UL quadrant
QC.ODDEVEN.URMEAN ,oc_UR_mean, mean of odd even column effect in UR quadrant
QC.ODDEVEN.URSTDEV ,oc_UR_stdev, mean of odd even column effect in UR quadrant
QC.ODDEVEN.LLMEAN ,oc_LL_mean, mean of odd even column effect in LL quadrant
QC.ODDEVEN.LLSTDEV ,oc_LL_stdev, mean of odd even column effect in LL quadrant
QC.ODDEVEN.LRMEAN ,oc_LR_mean, mean of odd even column effect in LR quadrant
QC.ODDEVEN.LRSTDEV ,oc_LR_stdev, mean of odd even column effect in LR quadrant
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ALGORITHM |
Description of algorithms:
ODDEVEN Derive the flux values for each twflat raw frame per quadrant and per odd and even columns.
Derive (odd minus even) / (odd + even) for each quadrant and derive mean value over all frame in
the stack. Derive stdev per quadrant over all frames of the raw frame stack.
mean=0.0004 is normal. stdev=0 means odd-even column effect is linear and can be flatfielded.
mean=0.02 is an intervention criterion, since the linearity relation of odd and even columns
differ by 2% and since stdev also increases. stdev is a measure about how much the
non-linear parts deviate from each other.
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CERTIF |
Quality diminishing features (not under control, but tolerated) :
- 'moving'dust grains
- persistence of the through slit image
Reasons for rejection:
- oddeven column effect
- less than 5 raw flat frames
- flux-range < 1.0x (in LW-arm a more tolerant criterion is used)
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COMMENTS |
local difference frames (current product minus last one) and reference difference frames
(current product minus reference) are provided in the detailed section of certifyProducts
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[2012-06-20T10:57:10] created by qcDocu v1.1.2, a tqs tool
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