VIMOS Scientific CCD System

CCD Test Report "TINA"

CCD Specification

CCD alias name :	TINA
Type :	EEV 44-82, backside illuminated, single layer AR coated
Number of photosensitive pixels :	[H] 2048, [V] 4102
Number of outputs :	2
Pixel size :	15 x 15 microns
Overall rating :	Science

Readout Noise and Conversion Factor

	Readout Speed ( kps )	Readout Noise ( e^- rms )	Conversion factor ( e^- / ADU )
Port A ( left bottom )	357	5.2 ± 0.02	2.17 ± 0.05
Port B ( right bottom )	357	5.1 ± 0.02	2.05 ± 0.05

Quantum Efficiency

Wavelength [nm]	PRNU	QE [%]
320	3.8	57
340	3.5	64
360	3.5	66
380	2.3	76
400	1.6	85
450	1.2	88
500	1.1	87
550	1.1	83
600	1.0	82

Wavelength [nm]	PRNU	QE [%]
650	1.0	80
700	1.0	73
750	1.0	66
800	1.3	57
850	1.1	46
900	3.2	31
950	7.1	16
1000	10.0	6
1100	15.3	0

Cosmetic Defects

Low Level Flat Field Mean number of electrons per pixel » 4.000
Type of Defect :	Location (x,y) :	Number of pixels affected :
Trap	843,63	Up to the top
Hot pixels column	153,1	Up to the top
Trap	1726,3912	Up to the top

Bias Image 0 sec. dark exposure, 4.157 pixels above 5 s
Type of Defect :	Location (x,y) :	Number of pixels affected :
All defect column	153,1	All column
Hot pixels trail	1624,3852	Up to the top

Long Exposure Dark Images 3 exposures of 3.600 sec. each, 4.164 pixels above 5 s
Type of Defect :	Location (x,y) :	Number of pixels affected :
All defect column	153,1	Up to the top
Hot pixels trail	1624,3852	Up to the top

Note : Faint remaining patch @ x = 2048, y = 2117 when l < 400 nm

Images at -120C

All images got the serial register at the bottom of the image. All are full frames images including 50 pixels of X-pre-/overscan and 100 pixels of Y-overscan.

All images are full frames (1 CCD pixel = 1 screen pixel) otherwise mentionned.

Bias frame

Dark frame (single onehour exposure dark frame), slight noise pattern is visible + cosmic ray hits

Cosmetics, flats fields from 60 cm diameter integrating sphere.

340 nm, 4 nm bandwidth

739 nm, 4 nm bandwidth

980 nm, 4 nm bandwidth

Linearity

	Speed ( kps )	Non-Linearity		Range ( ADU )	Saturation level ( e^- )
		Peak - Peak ( % )	Rms ( % )
Port A ( left bottom )	357	- 0.28 / + 0.35	NA	0 - 65535	130 K
Port B ( right bottom )		- 0.25 / + 0.30

Dark Current

Mean dark current 2.5 ± 0.1 e^-/pixel/hour @ - 120 °C.
Exposure time used in frames : 3 exposures of 3.600 sec. each.

Notes : Clean dark frame.
Remanence may occur if dark frames are taken just after flat fields.

Cosmic Ray Hit Event

Cosmic hit event rate :

23 ± 4 events/min/CCD;
1.1 ± 0.2 events/min/cm².

Charge Transfer Efficiency

Vertical CTE to port A/B : 0.9999988 (almost six 9 s);
horizontal CTE to port A/B : 0.9999995 (six 9 s, 5).

Measurement Conditions

Prescan :

[H] 50, [V] 0

Overscan :

[H] 50, [V] 70

Temperature :

- 120 °C

Bias Voltages (V) :

	Port A (left bottom)	Port B (right bottom)
RD	12.0	12.0
OD	25.0	25.0
JD	25.0	25.0
IF	- 8 ® + 4	-

Gain (Port A, B) :

Stage 1 = 2.25,
Stage 2 = 5.0

General Comments :

No error bars available for QE measurements.

Report Date :

27/April/1999

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