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VIMOS Scientific CCD System
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CCD Test Report "CARLOS"

CCD Specification

CCD alias name : CARLOS
Type : EEV 44-82, backside illuminated, single layer AR coated
Number of photosensitive pixels : [H] 2048, [V] 4102
Number of outputs : 2
Pixel size : 15 x 15 microns
Overall rating : Science


Readout Noise and Conversion Factor

Readout Speed
( kps )		 Readout Noise
( e- rms )		 Conversion factor
( e- / ADU )
Port A ( left bottom ) 357 5.1 ± 0.02 2.2 ± 0.05
Port B ( right bottom ) 357 5.3 ± 0.02 2.1 ± 0.05


Quantum Efficiency

Wavelength [nm] PRNU QE [%]
320 4.9 45
340 4.6 53
360 4.6 59
380 3.2 74
400 2.2 82
450 1.5 87
500 1.3 87
550 1.3 82
600 1.3 81
Wavelength [nm] PRNU QE [%]
650 1.3 78
700 1.3 71
750 1.4 63
800 1.6 51
850 1.4 38
900 2.2 27
950 6 15
1000 11 5
1100 12 0


Cosmetic Defects

Low Level Flat Field
Mean number of electrons per pixel » 4.000
Type of Defect : Location (x,y) : Number of pixels affected :
Trap 1331,3082 Up to the top, double size width
Bias Image
0 sec. dark exposure, 7.090 pixels above 5 s
Type of Defect : Location (x,y) : Number of pixels affected :
Hot pixels trail 1330,1621 Up to the top
Hot pixels trail 1999,2619 Up to the top
Hot pixels trail 391,1557 Up to the top
Long Exposure Dark Images
4 exposures of 1.800 sec. each, 631 pixels above 5 s
Type of Defect : Location (x,y) : Number of pixels affected :
Hot pixels trail 1999,2575 200
Hot pixels trail 391,1506 200
Hot pixels trail 1330,1563 140

Images at -120C

All images got the serial register at the bottom of the image. All are full frames images including 50 pixels of X-pre-/overscan and 100 pixels of Y-overscan.

All images are full frames (1 CCD pixel = 1 screen pixel) otherwise mentionned.

Bias frame

Dark frame   (5 median stacked 1 hour exposure dark frames), slight noise pattern is visible

Cosmetics, flats fields from 60 cm diameter integrating sphere.

340 nm, 4 nm bandwidth   (2048 x 512 central CCD area)

600 nm, 4 nm bandwidth

900 nm, 4 nm bandwidth   (2048 x 512 central CCD area)

Linearity

  Speed
( kps )		 Non-Linearity Range
( ADU )		 Saturation level
( e- )
Peak - Peak ( % ) Rms ( % )
Port A ( left bottom ) 357 - 0.43 / + 0.49 NA 0 - 65535 130 K
Port B ( right bottom ) - 0.35 / + 0.5



Dark Current

Mean dark current 0.7 ± 0.2 e-/pixel/hour @ - 120 °C.
Exposure time used in frames : 4 exposures of 1.800 sec. each.

Notes :    Clean dark frame.
Remanence may occur if dark frames are taken just after flat fields.


Cosmic Ray Hit Event

Cosmic hit event rate :    22 ± 4 events/min/CCD;
1.1 ± 0.2 events/min/cm2.



Charge Transfer Efficiency

Vertical CTE to port A/B : 0.9999988 (almost six 9 s);
horizontal CTE to port A/B : 0.9999995 (six 9 s, 5).


Measurement Conditions

Prescan : [H] 50, [V] 0
Overscan : [H] 50, [V] 70
Temperature :   - 120 °C
Bias Voltages (V) :  
  Port A
  (left bottom)  		 Port B
  (right bottom)  
   RD    11.0 11.0
OD 23.0 23.0
JD 24.0 24.0
IF - 8 ® + 4 -
Gain (Port A, B) : Stage 1 = 2.25,
Stage 2 = 5.0
 
General Comments :    No error bars available for QE measurements.
Do not use OD > 25, because glowing may occur.
Report Date : 27/April/1999

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