Volans

: ESO CCD Test Report

General information

EEV 44-82-1-A57

CCD Name :

Volans

Grade :

Science

Serial Number :

02395-17-01

Type : Backside, Single layer AR Pixel size 15 x 15 μm

Number of photosensitive pixels 2048 x 4102 [HxV]

Number of outputs : 2

Overall rating :

Measurement made by

S.De

the

5-May-2003

Data reduced by

JTH

the

13-May-2003

Setup

D-Marc 2

Position in the head

Tested with the CCD

Vela

Concession form

Volt table

Channel voltage potential

10.25

This table defines the voltages which will be applied to peripherals

at initialisation time. It also defines the high and low limits which may

be set for these voltages

BIASBRD is for the EEV CCD-44 in the mosaic

# BRD_ID PERIPH_ID

# CONNECTOR P0 - A

LOW

HIGH

TOLERANCE

INIT_VAL

BRD_ANABIAS0 ANB_PRESET_VOLT_A

-3500

-1000

10000

-3500

#OG1R

BRD_ANABIAS0 ANB_PRESET_VOLT_B

-2500

-1000

10000

-2500

#OG2R

BRD_ANABIAS0 ANB_PRESET_VOLT_C

2000

25000

10000

22000

#ODR

BRD_ANABIAS0 ANB_PRESET_VOLT_D

2000

15000

10000

11750

#RDR

BRD_ANABIAS0 ANB_PRESET_VOLT_E

2000

25000

10000

25000

#JDR

BRD_ANABIAS0 ANB_PRESET_VOLT_F

#not used

BRD_ANABIAS0 ANB_PRESET_VOLT_G

#not used

BRD_ANABIAS0 ANB_PRESET_VOLT_H

#not used

# CONNECTOR PO - B

LOW

HIGH

TOLERANCE

INIT_VAL

BRD_ANABIAS0 ANB_PRESET_VOLT_I

-3500

-1000

10000

-3500

#OG1L

BRD_ANABIAS0 ANB_PRESET_VOLT_J

-2500

-1000

10000

-2500

#OG2L

BRD_ANABIAS0 ANB_PRESET_VOLT_K

2000

25000

10000

22000

#ODL

BRD_ANABIAS0 ANB_PRESET_VOLT_L

2000

15000

10000

11750

#RDL

BRD_ANABIAS0 ANB_PRESET_VOLT_M

2000

25000

10000

25000

#JDL

BRD_ANABIAS0 ANB_PRESET_VOLT_N

#not used

BRD_ANABIAS0 ANB_PRESET_VOLT_O

2000

19000

10000

18000

#DDLR

BRD_ANABIAS0 ANB_PRESET_VOLT_P

#not used

#The anabias board also has an opto isolated peripheral

BRD_ANABIAS0 ANB_OPTOOUT

32767

255

CLOCKDRIVER BOARD 0 is for the EEV CCD44 in the mosaic

# BRD_ID PERIPH_ID

# CONNECTOR PO-A

LOW

HIGH

TOLERENCE

INIT_VAL

BRD_CLKDRV0 CLKDRV_DAC0_LO

-5000

1000

-5000

#SWL

BRD_CLKDRV0 CLKDRV_DAC0_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC1_LO

-5000

1000

-5000

#SWR

BRD_CLKDRV0 CLKDRV_DAC1_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC2_LO

-5000

1000

-5000

#RF3

BRD_CLKDRV0 CLKDRV_DAC2_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC3_LO

-5000

1000

-5000

#RF2L

BRD_CLKDRV0 CLKDRV_DAC3_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC4_LO

-5000

1000

-5000

#RF1L

BRD_CLKDRV0 CLKDRV_DAC4_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC5_LO

-5000

1000

-5000

#RF2R

BRD_CLKDRV0 CLKDRV_DAC5_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC6_LO

-5000

1000

-5000

#RF1R

BRD_CLKDRV0 CLKDRV_DAC6_HI

5000

1000

5000

BRD_CLKDRV0 CLKDRV_DAC7_LO

-6000

1000

-6000

#DG

BRD_CLKDRV0 CLKDRV_DAC7_HI

6000

1000

6000

# CONNECTOR PO-B

LOW

HIGH

TOLERENCE

INIT_VAL

BRD_CLKDRV0 CLKDRV_DAC8_LO

-12000

-4000

1000

-8000

#IF1

BRD_CLKDRV0 CLKDRV_DAC8_HI

-2000

3000

1000

2000

BRD_CLKDRV0 CLKDRV_DAC9_LO

-12000

-4000

1000

-8000

#IF2

BRD_CLKDRV0 CLKDRV_DAC9_HI

-2000

3000

1000

2000

BRD_CLKDRV0 CLKDRV_DAC10_LO

-12000

-4000

1000

-8000

#IF3

BRD_CLKDRV0 CLKDRV_DAC10_HI

-2000

3000

1000

2000

BRD_CLKDRV0 CLKDRV_DAC11_LO

1000

#empty

BRD_CLKDRV0 CLKDRV_DAC11_HI

1000

BRD_CLKDRV0 CLKDRV_DAC12_LO

-6000

-4000

1000

-6000

#FRL

BRD_CLKDRV0 CLKDRV_DAC12_HI

6000

8000

1000

6000

BRD_CLKDRV0 CLKDRV_DAC13_LO

-6000

-4000

1000

-6000

#FRR

BRD_CLKDRV0 CLKDRV_DAC13_HI

6000

8000

1000

6000

# Gain should be interpreted as follows

# There are two gains, gain1 is on the preamp, gain2 is on the video board.

# Gain1 =

# 3 == 1.5

# 1 == 2.25

# 0 == 3.0

# Gain2 =

# 0 = Minimum (2.5)

# 1 = Maximum (12.5)

# BRD_ID PERIPH_ID

LOW

HIGH

TOLERANCE

INIT_VAL

BRD_VIDBRD0 VID_GAIN1_CHAN0

BRD_VIDBRD0 VID_GAIN1_CHAN1

BRD_VIDBRD0 VID_GAIN1_CHAN2

BRD_VIDBRD0 VID_GAIN1_CHAN3

BRD_VIDBRD0 VID_GAIN2_CHAN0

BRD_VIDBRD0 VID_GAIN2_CHAN1

BRD_VIDBRD0 VID_GAIN2_CHAN2

BRD_VIDBRD0 VID_GAIN2_CHAN3

BRD_VIDBRD0 VID_FILT_CHAN0

BRD_VIDBRD0 VID_FILT_CHAN1

BRD_VIDBRD0 VID_FILT_CHAN2

BRD_VIDBRD0 VID_FILT_CHAN3

BRD_VIDBRD0 VID_TESTVID_CHAN0

BRD_VIDBRD0 VID_TESTVID_CHAN1

BRD_VIDBRD0 VID_TESTVID_CHAN2

BRD_VIDBRD0 VID_TESTVID_CHAN3

# Video Offsets are in 0.001 volts

# BRD_ID PERIPH_ID

LOW

HIGH

TOLERANCE

INIT_VAL

BRD_VIDBRD0 VID_OFFSET_CHAN0

65535

6553

BRD_VIDBRD0 VID_OFFSET_CHAN1

65535

6553

BRD_VIDBRD0 VID_OFFSET_CHAN2

65535

6553

BRD_VIDBRD0 VID_OFFSET_CHAN3

65535

6553

Quantum Efficiency

Clock mode :

225kpx/rr/HG/512

Conversion factor

1.1023e-/ADU

±0.005211

for

22815.5ADU

Rms noise :

3.6909e-

±0.03923

CCD Temperature :

-120.2Cº

Wav.

QE%

QE error

PRNU rms%

Wav.

QE%

QE error

PRNU rms%

300

33.1

0.2

2.8

660

74.4

0.0

1.0

310

51.6

0.0

2.4

680

72.1

0.0

1.0

320

50.7

0.0

2.1

700

69.2

0.3

1.0

330

53.2

0.0

2.0

720

65.4

0.0

1.0

340

54.6

0.0

2.0

740

61.3

0.0

1.1

350

55.0

0.0

2.0

750

59.0

0.0

1.1

360

55.4

0.0

2.0

760

56.7

0.0

1.1

370

54.6

0.1

1.7

780

52.1

0.0

1.1

380

67.3

0.1

1.3

800

47.7

0.0

1.2

390

73.9

0.1

1.1

820

43.5

0.0

1.2

400

78.3

0.1

1.1

840

37.8

0.0

1.1

420

82.3

0.0

1.0

850

36.2

0.0

1.2

440

83.7

0.1

1.0

860

34.6

0.0

1.4

450

83.8

0.0

1.0

880

29.6

0.0

1.3

460

83.9

0.0

1.0

900

24.3

0.0

1.5

480

83.3

0.0

0.9

920

19.2

0.0

1.7

500

82.3

0.1

0.9

940

14.2

0.0

1.3

520

81.4

0.0

0.9

950

12.2

0.0

1.7

540

80.8

0.0

0.9

960

10.1

0.0

2.1

550

80.5

0.0

0.9

980

6.5

0.0

2.0

560

80.2

0.0

0.9

1000

3.7

0.0

1.9

580

79.6

0.0

0.9

1020

1.8

0.0

2.5

600

78.8

0.0

1.0

1040

0.6

0.0

2.9

620

77.7

0.0

0.9

1060

0.3

0.0

3.4

640

76.2

0.0

1.0

1080

0.1

0.0

4.3

650

75.3

0.0

1.0

1100

0.1

0.0

5.2

Table 1: Measurements of the quantum efficiency and PRNU

Quantum efficiency, comparison

In this section you can compare the QE we measured with the testbench and:

l QE Minimum specification

l Typical QE

l QE from Marconi

Figure 1: Comparison between the QE measured by ESO, the QE measured by Marconi, ESO specification and minimum specification

Figure 2: Ratio between the ESO measurements and the ESO minimum specification

Quantum efficiency, special specification

Special specification

Wavelength (nm)

Minimum spec.(%)

ESO measure. (%)

Result

350

55.0

400

78.3

Under the minimum spec.

650

75.3

Under the minimum spec.

900

24.3

Under the minimum spec.

Conclusion:

No this CCD is not in the 25 %

Table 2: Minimum specification for 25 % of the CCDs.

Difference between QE measurements made by ESO and Marconi

Comparison QE ESO and Marconi

Wavelength (nm)

QE ESO (%)

QE E2V (%)

Difference (ESO - E2V %)

Relative diff. (E2V as reference %)

Ratio QE ESO / QE E2V

350

55.0

54.0

1.0

1.9

1.0

400

78.3

77.4

0.9

1.2

1.0

500

82.3

82.0

0.3

0.4

1.0

650

75.3

73.9

1.4

1.9

1.0

Table 3: Difference and relative difference between ESO measurements and E2V

Figure 3: Graphic representation of the fdifference and the relative difference

Figure 4: Ration between the ESO measurements and the E2V Measurements

PRNU comparison

In this section you can compare the PRNU we measured at ESO and:

l PRNU Minimum specification

l PRNU from Marconi

Figure 5: Comparison between the PRNU measured by ESO, the PRNU measured by Marconi, and the maximum specification

Figure 6: Ratio between the ESO measurements and the maximum specification

Comparison PRNU ESO and PRNU Marconi

Wavelength (nm)

PRNU ESO (rms %)

Maximum spec.

PRNU E2V

Difference (ESO - E2V)

Relative difference (E2V as reference)

Ratio PRNU ESO / PRNU E2V

320

2.1

6.0

350

2.0

5.0

2.3

-0.3

-11.3

0.9

400

1.1

2.5

1.2

-0.1

-11.7

0.9

500

0.9

2.0

1.1

-0.2

-13.8

0.9

Table 4: difference and relative difference between ESO and E2V measurements

Comparison with the contract

In this section you will see the if the values we have measured for the QE and the PRNU are in accordance with the contract.

Wavelength (nm)

PRNU

320

340

350

360

380

400

450

500

Below the specification

550

Below the specification

600

Below the specification

650

700

750

800

850

900

Below the specification

950

Below the specification

1000

Below the specification

Table 5: Comparison between the values we have measured and the specifications in the contract

Cosmetic

Click here to see the images

Cosmetic defects

In this section we expose the hot pixel, the dark pixel, the trap and the very large trap we have found.

Hot pixel

A hot pixel provides a signal of > 60 e- / pixel / hour.

Very bright pixel

a very bright pixel provides a signal of > 200000 e-/pixel/hour

Dark pixel

A dark pixel is one with 50% or less than the average output for uniform intensity light level, measured with a flat field level around 500 photo-electrons

Trap

A trap is defined as a pixel that captures more than 10 electrons, measured with a flat field level around 500 photo-electrons.

Very large trap

A very large trap is defined as a pixel that captures more than 10 000 electrons, measured with a flat field level around 90% of full well capability.

Bad column

A bad column is 10 or more contiguous hot or dark pixels in a single column or a very bright pixel or a very large trap.

Hot pixel

Dark pixel

Very bright pixel (a)

Trap

Very large trap (b)

Sup. 10 contiguous pixels (c)

Total bad column (a+b+c)

ESO

E2V

223

Table 6: Cosmetic defects measured by ESO and E2V

Dark and Bias

Click here to see the images

Readout noise and conversion factor

Conversion factor, recommend specification:

0.55

e-/pixel/hour

Maximum readout noise at 50kpix/s:

Maximum readout noise at 225kpix/s:

2.8

Conversion factor

Readout noise

50kpix/s

Left port

0.53

2.70

Right port

0.53

3.25

225kpix/s

Left port

0.55

3.77

Right port

0.54

3.76

Table 7: Readout noise and Conversion factor measured at 50 and 225kpix/s

Linearity

Minimum specification:

(%)

Rms non linearity (%)

0.30

Peak to peak non linearity (%)

1.13

Table 8: Linearity

Click here to see the graphics

Dark current

Exposure time (s):

3600

Readout mode:

50kpix/s

Port:

Right

Minimum specification:

e-/pixel/hour

Dark current

error

-0.18

0.29

ADU/pixel/hour

-0.10

0.15

e-/pixel/hour

Table 9: Dark current in electron per pixel and per hour

Charge Transfer Efficiency (CTE)

Method used:

EPER

Minimum specification:

0.999995

CTE (ESO)

CTE (E2V)

CTE Serial (Horizontal) Left

Load value

0.999996

CTE Serial (Horizontal) Right

0.999997

CTE Parallel (Vertical)

0.999999

Table 10: Charge transfer efficiency measured at 50kpix/s and the high gain amplification