Centaurus: ESO CCD Test Report
EEV 44-82 -1-A57
CCD name : Centaurus
Serial number
: 9253-12-02
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of
outputs : 2
Overall rating :
Test date :
Clock mode: EEV 1p/225k/HG 512 Facteur de convertion0.55743e-/ADU ±0.001413 pour 19221.5ADU Bruit RMS= 4.3414e- ±0.2035 CCD temperature : -127.5Cº Window area is : X1= 54 X2= 2096 Y1= 1 Y2= 510 Bandwidth 5nm Long. QE% PRNU rms% Phase= 320 51.8 ±1.5 5.08 7.022918 330 57.1 ±1.6 4.89 6.983739 340 60.3 ±1.2 4.79 6.960706 350 61.4 ±0.6 4.82 6.96772 360 63.6 ±0.63 4.8 6.966903 370 67.6 ±0.67 4.33 6.866038 380 74.2 ±0.73 3.18 6.563983 390 80.4 ±0.83 2.38 6.275785 400 82.8 ±0.84 1.93 6.068561 420 84.7 ±0.85 1.48 5.800091 440 85.7 ±0.86 1.29 5.656704 460 84.7 ±0.85 1.19 5.5687 480 83.3 ±0.84 1.15 5.533916 500 83.1 ±0.83 1.09 5.475505 520 82.4 ±0.83 1.09 5.483837 540 81.1 ±0.82 1.06 5.455268 560 79.6 ±0.8 1.08 5.478313 580 79 ±0.79 1.07 5.471101 600 77.6 ±0.77 1.16 5.556521 620 76.6 ±0.75 1.22 5.615405 640 75 ±0.73 1.4 5.75091 660 72.8 ±0.71 1.64 5.909241 680 70.2 ±0.67 1.92 6.050243 700 67 ±0.63 2.18 6.171075 720 64.6 ±0.59 2.5 6.270137 740 61.6 ±0.56 2.89 6.391506 760 58 ±0.52 3.16 6.470081 780 54.4 ±0.48 3.51 6.555355 800 49.9 ±0.43 3.74 6.624481 820 45.4 ±0.39 3.91 6.642589 840 40.6 ±0.34 4.36 6.75658 860 35.4 ±0.3 4.57 6.819146 880 30.1 ±0.24 5.3 6.952618 900 25.2 ±0.2 5.82 7.084044 920 19.7 ±0.15 6.14 7.183002 940 15.1 ±0.12 7.57 7.38505 960 11.1 ±0.085 8.26 7.491048 980 7.43 ±0.056 9.86 7.653822 1000 4.38 ±0.033 10.6 7.73565 1040 0.766 ±0.0057 10.4 7.764373 1100 0.0864 ±0.00064 13.1 7.994556
Table 1: Measurement of the Quantum Efficiency.
Figure 1: Graphic representation of the QE.
Figure 2: Graphic representation of the PRNU.
In this section you can compare the QE we measured with the testbench and
QE Minimum specification
Typical QE
QE from Marconi
Figure 3: Comparison between the QE measured by ESO, the QE measured by Marconi,
ESO specification and minimum specification.
Comparison QE ESO / QE Marconi |
||||
Wavelength (nm) |
QE ESO (%) |
QE Marconi (%) |
Difference (Eso - Marc. %) |
Relative difference (Marconi as reference %) |
350 |
61.4 |
57.7 |
3.7 |
6.4 |
400 |
82.8 |
82.6 |
0.2 |
0.2 |
500 |
83.1 |
81.4 |
1.7 |
2.1 |
650 |
73.9 |
73 |
0.8 |
1.1 |
900 |
25.2 |
25.6 |
-0.4 |
-1.6 |
Table 2: Difference and relative difference between ESO measurement and Marconi.
Figure 4: Graphic representation of the difference and the relative difference.
For the flat field we use three wavelengths, 350nm, 600nm and 900nm. For each wavelength we make two images, high level (45000 ADU) and low level (1000 ADU).
350nm (UV), bandwidth 5nm |
600nm, bandwidth 5nm |
900nm, bandwidth 5nm |
|||
High level |
Low level |
High level |
Low level |
High level |
Low level |
Table 3: Flat field for three wavelengths.
The time exposure, for the long dark exposure, is 3600 seconds.
Table 4: Bias and dark.
Clock mode: EEV 1p/225k/HG 512 Conversion Factor= 0.55996e-/ADU ±0.006228 for 26138.7ADU RMS noise = 5.0088e- ±0.7387 Clock mode: EEV 1p/50k/HG 512 Right port Conversion factor= 0.53674e-/ADU ±0.001465 for 26266.6ADU RMS noise= 2.8367e- ±0.1701 Clock mode: 50kpx/4p/HG/512 Left port Conversion factor= 0.66114e-/ADU ±0.002947 for 23286.8ADU RMS noise= 3.4024e- ±0.3855
RMS non linearity (%) = 0.310187 Peak to peak non linearity (%)= 0.965229
Figure 5: Error of linearity.
Figure 6: Residual non linearity.
Exposure time (s) = 3600 Dark current : 1.8e-/hour/pixel
Horizontal CTE = 1 Vertical CTE = 0.9999995
In this section we expose the hot pixel, the dark pixel, the trap and the very large trap we found.
A hot pixel provides a signal of > 60 e- / pixel / hour.
Result: 74 hot points.
Position |
|||
X=339; Y=3516 X=370; Y=1340 X=780; Y=174 X=780; Y=175 X=780; Y=176 X=780; Y=177 X=784; Y=1651 X=790; Y=3791 X=819; Y=2630 X=822; Y=2630 X=823; Y=2630 X=825; Y=3614 X=1031; Y=2677 X=1250; Y=525 X=1520; Y=4089 X=1522; Y=3780 X=1522; Y=3783 X=1523; Y=3644 X=1541; Y=3630 |
X=1542; Y=3433 X=1545; Y=2944 X=1547; Y=2671 X=1557; Y=3779 X=1559; Y=3461 X=1570; Y=1628 X=1571; Y=4094 X=1572; Y=3869 X=1572; Y=3881 X=1573; Y=3689 X=1573; Y=3781 X=1574; Y=3909 X=1582; Y=2208 X=1601; Y=3689 X=1612; Y=3401 X=1633; Y=3547 X=1656; Y=3899 X=1677; Y=3668 X=1696; Y=3461 |
X=1721; Y=3364 X=1724; Y=3381 X=1753; Y=3334 X=1756; Y=3277 X=1815; Y=3724 X=1836; Y=3030 X=1849; Y=3334 X=1860; Y=2580 X=1861; Y=2907 X=1861; Y=2906 X=1861; Y=2908 X=1863; Y=2907 X=1863; Y=3631 X=1872; Y=3283 X=1872; Y=3284 X=1872; Y=3285 X=1872; Y=3286 X=1872; Y=3287 X=1872; Y=3288 |
X=1872; Y=3289 X=1872; Y=3290 X=1872; Y=3291 X=1875; Y=2076 X=1879; Y=3461 X=1879; Y=3462 X=1900; Y=3289 X=1915; Y=3338 X=1950; Y=3334 X=1984; Y=3106 X=1985; Y=3469 X=1985; Y=3475 X=2004; Y=3462 X=2011; Y=3924 X=2030; Y=1505 X=2031; Y=1498 X=2031; Y=1505 |
Total hot pixel: 74 |
Table 5: Position and images of the hot pixels.
A dark pixel is one with 50% or less than the average output for uniform intensity light level, measured with a flat field level around 500 photo-electrons.
Result: dark pixels detected.
Position |
|||
X= 3; Y= 2590 X= 26; Y= 153 X= 39; Y= 3798 X= 83; Y= 2180 X= 148; Y= 1874 X= 225; Y= 2238 X= 225; Y= 2239 X= 225; Y= 2240 X= 271; Y= 1629 X= 380; Y= 2767 X= 381; Y= 2767 X= 392; Y= 3010 X= 392; Y= 3011 X= 392; Y= 3012 X= 392; Y= 3039 |
X= 392; Y= 3040 X= 393; Y= 3038 X= 396; Y= 3009 X= 396; Y= 3010 X= 396; Y= 3011 X= 396; Y= 3012 X= 396; Y= 3013 X= 415; Y= 1797 X= 440; Y= 2971 X= 483; Y= 774 X= 492; Y= 1890 X= 599; Y= 1957 X= 639; Y= 734 X= 780; Y= 1639 X= 781; Y= 1639 |
X= 813; Y= 1538 X= 911; Y= 3118 X= 912; Y= 3117 X= 912; Y= 3118 X= 912; Y= 3119 X= 913; Y= 3117 X= 913; Y= 3118 X= 913; Y= 3119 X= 914; Y= 3118 X= 1008; Y= 1467 X= 1009; Y= 1466 X= 1009; Y= 1467 X= 1022; Y= 1802 X= 1092; Y= 197 X= 1092; Y= 1171 |
X= 1092; Y= 1172 X= 1093; Y= 197 X= 1093; Y= 198 X= 1093; Y= 1171 X= 1094; Y= 197 X= 1103; Y= 880 X= 1217; Y= 1463 X= 1343; Y= 1354 X= 1758; Y= 3260 X= 1765; Y= 2805 X= 1823; Y= 4100 X= 2003; Y= 2857 |
Total hot pixel: 57 |
Table 6: Position and images of the dark pixels.
A trap is defined as a pixel that captures more than 10 electrons, measured with a flat field level around 500 photo-electrons.
Result: Not available
A very large trap is defined as a pixel that captures more than 10 000 electrons, measured with a flat field level around 90% of full well capability.
Result: Not available.
A bad column is 10 or more contiguous hot or dark pixels in a single column or a very bright pixel or a very large trap.
Result: 2 bad columns.
Position |
Image |
|
X= 1870; Y= 3283 |
||
X= 1216; Y= 524 |
Table 7: Position and images of the bad columns. The values in the table are in ADU. Conversion factor: 1.1 e-/ADU
Here is a summary of cosmetic defects:
|
Hot pixel |
Dark pixel |
A very bright pixel (a) |
Trap |
Very large trap (b) |
Sup. 10 contiguous pixels (c) |
Total bad column (a+b+c) |
---|---|---|---|---|---|---|---|
ESO |
74 |
57 |
/ |
/ |
/ |
2 |
2 |
Marconi |
53 |
2 |
6 |
0 |
0 |
2 |
Table 8: Summary of cosmetic defects.
Be careful, in the ESO test report we didn't include the very large trap in the total bad column because for this CCD we couldn't measure this parameter.
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