EEV 44-82 -1-A57
CCD name : Antlia
Serial number :
9252-14-01
Type : Backside, Single layer AR Pixel size 15x15 µm
Number of photosensitive pixels 2048 x 4102 [HxV]
Number of
outputs : 2
Overall rating :
Test date : 06/12/2000
Clock mode: EEV 1p/225k/HG 512 Conversion Factor= 1.0444e-/ADU ±0.002625 for 23798.5ADU RMS noise = 4.1157e- ±0.01873 CCD temperature : -125Cº Window area is : X1= 62 X2= 2092 Y1= 8 Y2= 506 Bandwidth 5nm Wav. QE% PRNU rms% Phase= 320 56.6 ±1.6 4.74 7.5836 330 61.7 ±1.8 4.52 7.534309 340 64.9 ±1.3 4.4 7.50684 350 65.9 ±0.65 4.37 7.498648 360 67.9 ±0.67 4.33 7.486463 370 69.2 ±0.68 3.92 7.386187 380 76.6 ±0.76 2.95 7.092262 390 81.5 ±0.84 2.25 6.805535 400 83.3 ±0.84 1.86 6.599409 420 84.8 ±0.85 1.45 6.300591 440 85.2 ±0.85 1.29 6.153644 460 84.2 ±0.81 1.23 6.086355 480 82.7 ±0.83 1.16 5.996422 500 82.3 ±0.82 1.14 5.971531 520 81.7 ±0.82 1.1 5.915952 540 80.5 ±0.81 1.1 5.915647 560 79.1 ±0.79 1.07 5.890506 580 78.4 ±0.78 1.05 5.906931 600 77.3 ±0.77 0.981 5.864336 620 76.3 ±0.75 0.953 5.860217 640 74.9 ±0.73 0.941 5.861565 660 73 ±0.71 0.938 5.867514 680 71.2 ±0.68 0.952 5.89147 700 68.3 ±0.64 0.977 5.925734 720 65.3 ±0.6 1.06 6.024511 740 62 ±0.56 1.09 6.054193 760 58.4 ±0.52 1.26 6.201222 780 54.5 ±0.48 1.18 6.133688 800 49.5 ±0.43 1.4 6.314106 840 40.7 ±0.34 1.48 6.380544 900 26.3 ±0.21 1.68 6.51258 940 16.2 ±0.12 3.69 7.27692 1000 4.4 ±0.033 7.67 7.90931 1040 0.67 ±0.005 8.15 8.04976 1100 0.0703 ±0.00052 13.1 8.608617
Table 1: Measurement of the Quantum Efficiency
Figure 1: Graphic representation of the QE.
Figure 2: Graphic representation of the PRNU.
In this section you can compare the QE we measured with the testbench and
QE Minimum specification
Typical QE
QE from Marconi
Figure 3: Comparison between the QE measured by ESO, the QE measured by Marconi,
ESO specification and minimum specification.
|
Comparison QE ESO / QE Marconi |
||||
|
Wavelength (nm) |
QE ESO (%) |
QE Marconi (%) |
Difference (Eso - Marc. %) |
Relative difference (Marconi as reference %) |
|
350 |
65.9 |
58.2 |
7.7 |
13.2 |
|
400 |
83.3 |
83.8 |
-0.5 |
-0.6 |
|
500 |
82.3 |
82.6 |
-0.3 |
-0.4 |
|
650 |
74 |
76 |
-2.1 |
-2.7 |
|
900 |
26.3 |
28.3 |
-2 |
-7.1 |
Table 2: Difference and relative difference between ESO measurement and Marconi.
Figure 4: Graphic representation of the difference and the relative difference.
For the flat field we use three wavelengths, 350nm, 600nm and 900nm. For each wavelength we make two images, high level (45000 ADU) and low level (1000 ADU).
350nm (UV), bandwidth 5nm |
600nm, bandwidth 5nm |
900nm, bandwidth 5nm |
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|
|
|
|
|
|
|
High level |
Low level |
High level |
Low level |
High level |
Low level |
Table 3: Flat field for three wavelengths.
The time exposure, for the long dark exposure, is 3600 seconds.
|
Bias |
Long exposure dark image |
|---|---|
|
|
|
Table 4: Bias and dark.
Clock mode: EEV 1p/50k/HG 512 Conversion Factor= 0.53875e-/ADU ±0.001877 for 26825.4ADU RMS noise = 2.294e- ±0.1069 Clock mode: EEV 1p/50k/HG 512 Conversion Factor= 0.53765e-/ADU ±0.001575 for 25297.6ADU RMS noise = 2.5385e- ±0.2663 Clock mode: EEV 1p/225k/HG 512 Conversion Factor= 0.5205e-/ADU ±0.001527 for 26199.4ADU RMS noise = 4.0854e- ±0.1979
RMS non linearity (%) = 0.194165 Peak to peak non linearity (%)= 0.639617
Figure 5: Error of linearity
Figure 6: Residual non linearity.
Exposure time (s) = 3600 Dark current : 0.64 ± 0.06 ADU Dark current : 0.32 ± 0.04 e-/hour/pixel Cosmic event rate : 1.14 ± 0.05272 events/min/cm²
Horizontal CTE = 0.999993 Vertical CTE = 0.9999998
In this section we expose the hot pixel, the dark pixel, the trap and the very large trap we found and how.
A hot pixel provides a signal of > 60 e- / pixel / hour. To find them we use a median dark image. We take the median of the image and to find the hot point we add the mean in (e- / pixel / hour) plus the limit (60 e- / pixel / hour). All the pixel which have a value upper than this limits are considered as hot pixel. I repeat this manipulation with two other median filter to confirm the results
Result: six hot points.
On our images these points are to the coordinates:
|
Position |
Image |
Histogram around the hot pixel |
X= 1994; Y= 1101 X= 1995; Y= 1101 |
|
|
X= 1348; Y= 1476 X= 1349; Y= 1476 X= 1348; Y= 1477 |
|
|
X= 0281; Y= 2315 |
|
|
Table 5: Position and images of the hot pixels.
A dark pixel is one with 50% or less than the average output for uniform intensity light level, measured with a flat field level around 500 photo-electrons.
Result: No dark pixel detected.
A trap is defined as a pixel that captures more than 10 electrons, measured with a flat field level around 500 photo-electrons.
Result: Not available
A very large trap is defined as a pixel that captures more than 10 000 electrons, measured with a flat field level around 90% of full well capability.
Result:
On our images this point is to the coordinates:
|
Position |
Image |
Histogram around the very large trap |
|---|---|---|
X= 0895; Y= 2543 |
|
|
Table6: Position and images of the very large trap.
A bad column is 10 or more contiguous hot or dark pixels in a single column or a very bright pixel or a very large trap.
Result: One bad column was detected in the section Very large trap. The coordinate are X= 895; Y= 2543.
Here is a summary of cosmetic defects:
|
Hot pixel |
Dark pixel |
Trap |
Very large trap |
Bad column |
|---|---|---|---|---|
|
6 |
0 |
0 |
1 |
1 |
Table 7: Summary of cosmetic defects.
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