FORS 2 - CCD System

Cosmetic Defects

Low Level Flat Field Mean number of electrons per pixel » 4.000
Type of Defect :	Location (x,y) :	Number of pixels affected :
Low QE at l < 800 nm	102, 2019	18.216 The left upper corner is affected by a coating defect, it can be flat field out.
Small trap	1100, 1647	50
Dark blob	639, 727	16 Pixels diameter
Dark blob	941, 1078	3 Pixels diameter
Dark blob	2014, 1192	3 Pixels diameter
Dark blob	729, 1402	5 Pixels diameter
2 Column trap	1227, 1669	< 1.000

Bias Image 0 sec. dark exposure, 38 pixels above 5 s
Type of Defect :	Location (x,y) :	Number of pixels affected :
Trail	1824, 796	3
Trail	534, 335	20

Long Exposure Dark Images
9 exposures of 3.600 sec. each, 572 pixels above 5 s

Notes :

Bias exhibits increasing ramp of 6 ADU from bottom to top.

No dark defects visible.

Cross talk not visible when saturated star is over part C/D, almost negligible when saturated star is over part A/B.

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Last update: Mar 16, 2004
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