CRIRES
Quality Control: flat field exposures |
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For flat-field exposures, the halogen lamp is used to illuminate the spectrograph. They are usually measured during daytime. Three health check settings with reference wavelengths 1090.4, 3218.6, and 4092.9 nm are defined and executed daily. Other settings are only measured when they are triggered by night-time observations. On flat fields measured befor June 2009, only the central ~400 pixels (in Y direction) are illuminated on the detector because of the (short) length of the slit. CRIRES flat fields significantly vary for different settings and detectors. There are also several artefacts that are typical for specific settings. For reference wavelengths below about 1500 nm, the intermediate slit vignets parts of each spectroscopic order so that the outer regions of detectors 1 and 4 are not (well) illuminated. A strong gradient is present in dispersion direction (i.e. in X direction) and there is sometimes also contamination from adjacent orders. For high Echelle orders, an optical ghost can be present on one detector. It is the result of a reflection from the detector to the grating.
QC1 parameters for CRIRES flat-field exposures are measured for each detector array separately. QC1 parameters
Trending For trending of flat field QC1 parameters, the daily health check settings with reference wavelengths of 1090.4, 3218.6, and 4302.7 nm are used. The flat field flux and the master rms measure the stability of the lamp, of the lamp shutter, of the positioning of the pre-dispersing prism, and of the intermediate slit. Because of the current instabilities for the intermediate slit, it has been decided to only trend flux and rms for detector #3. The number of bad pixels is trended for reference wavelengths 3218.6 nm. History January 2008: Reference wavelength
of one daily HC setting changed from 4302.7 to 4092.9 nm. |
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