| From | To | Comment |
| 2003-01-01 | 2010-05-19 | applicable from start of operations until instrument upgrade; flat-field and arc-lamp calibrations for MOS were measured with separate templates and were processed with separate pipeline recipes |
| 2010-05-19 | present | applicable after instrument upgrade; flat-field and arc-lamp calibrations for MOS are measured within the same template and are processed together with the same pipeline recipe |